Chang-Hai Sung

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Hsinchu County, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for scatterfield microscopical measurement
- Patent number 7,872,741
- Issue date Jan 18, 2011
- Industrial Technology Research Institute
- Sen-Yih Chou
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for scatterfield microscopical measurement
- Publication number 20090079969
- Publication date Mar 26, 2009
- INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Sen-Yih Chou
- G02 - OPTICS