Chang-Suk Oh

Person

Chungnam, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Nozzle standby port, apparatus for treating substrate including the...
- Patent number 12,124,169
- Issue date Oct 22, 2024
- Semes Co., Ltd.
- Sang Eun Noh
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Cleaning jig, substrate treating apparatus including the same, clea...
- Patent number 12,055,866
- Issue date Aug 6, 2024
- Semes Co., Ltd.
- Kisang Eum
- B08 - CLEANING
Information Patent Grant
Nozzle apparatus, apparatus and method for treating substrate
- Patent number 11,845,090
- Issue date Dec 19, 2023
- Semes Co., Ltd.
- Chang Suk Oh
- B08 - CLEANING
Information Patent Grant
Electroconductive particles and signal-transmitting connector havin...
- Patent number 11,763,959
- Issue date Sep 19, 2023
- TSE CO., LTD.
- Chang Su Oh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test apparatus for semiconductor package
- Patent number 11,609,244
- Issue date Mar 21, 2023
- TSE CO., LTD.
- Chang Su Oh
- G01 - MEASURING TESTING
Information Patent Grant
Test socket and test apparatus having the same
- Patent number 11,573,248
- Issue date Feb 7, 2023
- TSE CO., LTD.
- Chang Su Oh
- G01 - MEASURING TESTING
Information Patent Grant
Test socket and test apparatus having the same
- Patent number 11,506,705
- Issue date Nov 22, 2022
- TSE CO., LTD.
- Chang Su Oh
- G01 - MEASURING TESTING
Information Patent Grant
Electro-conductive part protecting member for signal transmission c...
- Patent number 11,233,352
- Issue date Jan 25, 2022
- TSE CO., LTD.
- Chang Su Oh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test socket and test apparatus having the same, manufacturing metho...
- Patent number 11,199,577
- Issue date Dec 14, 2021
- TSE CO., LTD.
- Chang Su Oh
- G01 - MEASURING TESTING
Information Patent Grant
Test socket and test apparatus having the same, manufacturing metho...
- Patent number 11,131,707
- Issue date Sep 28, 2021
- TSE CO., LTD.
- Chang Su Oh
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for processing a substrate
- Patent number 8,113,141
- Issue date Feb 14, 2012
- Semes Co., Ltd
- Chang-Suk Oh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plate, apparatus for adjusting temperature of substrate having the...
- Patent number 8,115,142
- Issue date Feb 14, 2012
- Semes Co, Ltd.
- Chang-Suk Oh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for processing a substrate
- Patent number 8,113,142
- Issue date Feb 14, 2012
- Semes Co., Ltd
- Chang-Suk Oh
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Apparatus and method for automatically switching communication/comm...
- Patent number 6,993,329
- Issue date Jan 31, 2006
- Hyundai Curitel, Inc.
- Sung-Joon Cho
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
SUBSTRATE PROCESSING APPARATUS
- Publication number 20240393705
- Publication date Nov 28, 2024
- SEMES CO., LTD.
- Sang Hyun PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIQUID SUPPLY UNIT AND SUBSTRATE TREATING APPARATUS INCLUDING SAME
- Publication number 20240157391
- Publication date May 16, 2024
- SEMES CO., LTD.
- Sung Jin BANG
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
TEST SOCKET
- Publication number 20240094251
- Publication date Mar 21, 2024
- TSE CO., LTD
- Chang Su OH
- G01 - MEASURING TESTING
Information Patent Application
NOZZEL STANDBY PORT, APPARATUS FOR TREATING SUBSTRATE INCLUDING THE...
- Publication number 20220206392
- Publication date Jun 30, 2022
- SEMES CO., LTD.
- Sang Eun NOH
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
TEST SOCKET AND TEST APPARATUS HAVING THE SAME
- Publication number 20220099730
- Publication date Mar 31, 2022
- TSE CO., LTD.
- Chang Su Oh
- G01 - MEASURING TESTING
Information Patent Application
CLEANING JIG, SUBSTRATE TREATING APPARATUS INCLUDING THE SAME, CLEA...
- Publication number 20220075280
- Publication date Mar 10, 2022
- SEMES CO., LTD.
- Kisang EUM
- B08 - CLEANING
Information Patent Application
TEST SOCKET AND TEST APPARATUS HAVING THE SAME
- Publication number 20220057433
- Publication date Feb 24, 2022
- TSE CO., LTD.
- Chang Su Oh
- G01 - MEASURING TESTING
Information Patent Application
ELECTROCONDUCTIVE PARTICLES AND SIGNAL-TRANSMITTING CONNECTOR HAVIN...
- Publication number 20220005626
- Publication date Jan 6, 2022
- TSE CO., LTD.
- Chang Su Oh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONDUCTOR PART PROTECTION MEMBER FOR SIGNAL TRANSMISSION CONNECTOR...
- Publication number 20210313730
- Publication date Oct 7, 2021
- TSE CO., LTD.
- Chang Su Oh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST APPARATUS FOR SEMICONDUCTOR PACKAGE
- Publication number 20210302468
- Publication date Sep 30, 2021
- TSE CO., LTD.
- Chang Su Oh
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET AND TEST APPARATUS HAVING THE SAME, MANUFACTURING METHO...
- Publication number 20210302494
- Publication date Sep 30, 2021
- TSE CO., LTD.
- Chang Su Oh
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET AND TEST APPARATUS HAVING THE SAME, MANUFACTURING METHO...
- Publication number 20210293880
- Publication date Sep 23, 2021
- TSE CO., LTD.
- Chang Su Oh
- G01 - MEASURING TESTING
Information Patent Application
NOZZLE APPARATUS, APPARATUS AND METHOD FOR TREATING SUBSTRATE
- Publication number 20210001357
- Publication date Jan 7, 2021
- SEMES CO., LTD.
- Chang Suk OH
- B08 - CLEANING
Information Patent Application
PLATE, APPARATUS FOR ADJUSTING TEMPERATURE OF SUBSTRATE HAVING THE...
- Publication number 20090014431
- Publication date Jan 15, 2009
- Chang-Suk Oh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR PROCESSING A SUBSTRATE
- Publication number 20080308038
- Publication date Dec 18, 2008
- Chang-Suk Oh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR PROCESSING A SUBSTRATE
- Publication number 20080308039
- Publication date Dec 18, 2008
- Chang-Suk Oh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for automatically switching communication/comm...
- Publication number 20030139138
- Publication date Jul 24, 2003
- Sung-Joon Cho
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Chang-Suk Oh

Person

Patents Grantslast 30 patents

Nozzle standby port, apparatus for treating substrate including the...

Cleaning jig, substrate treating apparatus including the same, clea...

Nozzle apparatus, apparatus and method for treating substrate

Electroconductive particles and signal-transmitting connector havin...

Test apparatus for semiconductor package

Test socket and test apparatus having the same

Test socket and test apparatus having the same

Electro-conductive part protecting member for signal transmission c...

Test socket and test apparatus having the same, manufacturing metho...

Test socket and test apparatus having the same, manufacturing metho...

Apparatus for processing a substrate

Plate, apparatus for adjusting temperature of substrate having the...

Apparatus for processing a substrate

Apparatus and method for automatically switching communication/comm...

Patents Applicationslast 30 patents

SUBSTRATE PROCESSING APPARATUS

LIQUID SUPPLY UNIT AND SUBSTRATE TREATING APPARATUS INCLUDING SAME

TEST SOCKET

NOZZEL STANDBY PORT, APPARATUS FOR TREATING SUBSTRATE INCLUDING THE...

TEST SOCKET AND TEST APPARATUS HAVING THE SAME

CLEANING JIG, SUBSTRATE TREATING APPARATUS INCLUDING THE SAME, CLEA...

TEST SOCKET AND TEST APPARATUS HAVING THE SAME

ELECTROCONDUCTIVE PARTICLES AND SIGNAL-TRANSMITTING CONNECTOR HAVIN...

CONDUCTOR PART PROTECTION MEMBER FOR SIGNAL TRANSMISSION CONNECTOR...

TEST APPARATUS FOR SEMICONDUCTOR PACKAGE

TEST SOCKET AND TEST APPARATUS HAVING THE SAME, MANUFACTURING METHO...

TEST SOCKET AND TEST APPARATUS HAVING THE SAME, MANUFACTURING METHO...

NOZZLE APPARATUS, APPARATUS AND METHOD FOR TREATING SUBSTRATE

PLATE, APPARATUS FOR ADJUSTING TEMPERATURE OF SUBSTRATE HAVING THE...

APPARATUS FOR PROCESSING A SUBSTRATE

APPARATUS FOR PROCESSING A SUBSTRATE

Apparatus and method for automatically switching communication/comm...