Chang Yong Yang

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San Diego, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit testing with power collapsed
- Patent number 9,267,989
- Issue date Feb 23, 2016
- QUALCOMM Incorporated
- Wei Chen
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit testing with power collapsed
- Patent number 8,713,388
- Issue date Apr 29, 2014
- QUALCOMM Incorporated
- Wei Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT TESTING WITH POWER COLLAPSED
- Publication number 20140223250
- Publication date Aug 7, 2014
- QUALCOMM Incorporated
- Wei Chen
- G01 - MEASURING TESTING
Information Patent Application
DYNAMICALLY SELF-RECONFIGURABLE DAISY-CHAIN OF TAP CONTROLLERS
- Publication number 20130086441
- Publication date Apr 4, 2013
- QUALCOMM Incorporated
- Chang Yong Yang
- G01 - MEASURING TESTING
Information Patent Application
Integrated Circuit Testing with Power Collapsed
- Publication number 20120216089
- Publication date Aug 23, 2012
- QUALCOMM Incorporated
- Wei Chen
- G01 - MEASURING TESTING