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Chang Yong
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Naperville, IL, US
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Patents Grants
last 30 patents
Information
Patent Grant
Compact apparatus for high-speed chemical spectral signature measur...
Patent number
12,007,323
Issue date
Jun 11, 2024
EPIR, INC.
Wei Gao
G01 - MEASURING TESTING
Information
Patent Grant
In-situ laser annealing of Te growth defects in CdZnTe (ilast-czt)
Patent number
11,725,300
Issue date
Aug 15, 2023
EPIR, INC.
Sushant Sonde
C30 - CRYSTAL GROWTH
Information
Patent Grant
Modified direct bond interconnect for FPAs
Patent number
11,670,616
Issue date
Jun 6, 2023
EPIR, INC.
Sushant Sonde
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Compact apparatus for high-speed chemical spectral signature measur...
Patent number
11,506,598
Issue date
Nov 22, 2022
EPIR, INC.
Wei Gao
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
System and method for optical mapping of semiconductor wafers at cr...
Publication number
20240201105
Publication date
Jun 20, 2024
Epir, Inc.
Issac L. Chang
G01 - MEASURING TESTING
Information
Patent Application
Compact Apparatus for High-Speed Chemical Spectral Signature Measur...
Publication number
20230228675
Publication date
Jul 20, 2023
Epir, Inc.
Wei Gao
G01 - MEASURING TESTING
Information
Patent Application
Radiation Hardened Infrared Focal Plane Array
Publication number
20230008594
Publication date
Jan 12, 2023
Yong Chang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
In-situ Laser Annealing of Te growth defects in CdZnTe (iLAST-CZT)
Publication number
20230002928
Publication date
Jan 5, 2023
Sushant Sonde
C30 - CRYSTAL GROWTH
Information
Patent Application
HgCdTe Metasurface-based Terahertz Source and Detector
Publication number
20220231214
Publication date
Jul 21, 2022
Epir, Inc.
Sushant Sonde
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Modified Direct Bond Interconnect for FPAs
Publication number
20220052020
Publication date
Feb 17, 2022
Sushant Sonde
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Compact Apparatus for High-Speed Chemical Spectral Signature Measur...
Publication number
20210164890
Publication date
Jun 3, 2021
Wei Gao
G01 - MEASURING TESTING