Changan Wang

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Plano, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Optimization of multiple feature lithography
- Patent number 7,386,182
- Issue date Jun 10, 2008
- Texas Instruments Incorporated
- Gary Guohong Zhang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Characterizing an exposure tool for patterning a wafer
- Patent number 6,847,919
- Issue date Jan 25, 2005
- Texas Instruments Incorporated
- Guohong Zhang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Optimization of multiple feature lithography
- Publication number 20060107249
- Publication date May 18, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Gary Guohong Zhang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Characterizing an exposure tool for patterning a wafer
- Publication number 20040167748
- Publication date Aug 26, 2004
- TEXAS INSTRUMENTS INCORPORATED
- Guohong Zhang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY