Changchun Zhen

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Method, apparatus and system of parallel IC test
- Patent number 8,847,615
- Issue date Sep 30, 2014
- Shanghai Xinhao (Bravechips) Micro Electronics Co. Ltd.
- Kenneth ChengHao Lin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method, apparatus and system of parallel IC test
- Publication number 20100237891
- Publication date Sep 23, 2010
- Shanghai XinHao (BraveChips) Micro Electronics Co. Ltd.
- Kenneth ChengHao Lin
- G01 - MEASURING TESTING