Changduk Kim

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South Burlington, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Test mode for IPP current measurement for wordline defect detection
- Patent number 7,257,038
- Issue date Aug 14, 2007
- Infineon Technologies AG
- Michael A. Killian
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus for Selecting Redundant Memory Cells
- Publication number 20080192543
- Publication date Aug 14, 2008
- QIMONDA NORTH AMERICA CORP.
- Jungwon Kim
- G11 - INFORMATION STORAGE
Information Patent Application
Test mode for IPP current measurement for wordline defect detection
- Publication number 20070153596
- Publication date Jul 5, 2007
- Michael A. Kilian
- G11 - INFORMATION STORAGE