Changhe Huang

Person

Novi, MI, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatuses, systems, and methods for detecting materials based on...
- Patent number 12,281,942
- Issue date Apr 22, 2025
- Wayne State University
- Gregory William Auner
- G01 - MEASURING TESTING
Information Patent Grant
Apparatuses, systems, and methods for detecting materials based on...
- Patent number 11,698,304
- Issue date Jul 11, 2023
- Wayne State University
- Gregory William Auner
- G01 - MEASURING TESTING
Information Patent Grant
Rapid assessment device for radiation exposure
- Patent number 11,192,104
- Issue date Dec 7, 2021
- Visca, LLC
- Gregory W. Auner
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Differential angle sensor
- Patent number 10,921,161
- Issue date Feb 16, 2021
- CHINA AUTOMOTIVE SYSTEMS, INC
- Haimian Cai
- G01 - MEASURING TESTING
Information Patent Grant
Torque and angular sensor
- Patent number 10,718,637
- Issue date Jul 21, 2020
- CHINA AUTOMOTIVE SYSTEMS, INC
- Haimian Cai
- G01 - MEASURING TESTING
Information Patent Grant
Static interferometer with step-style reflective element
- Patent number 9,778,105
- Issue date Oct 3, 2017
- Wayne State University
- Gregory W. Auner
- G02 - OPTICS
Information Patent Grant
Fourier-transform interferometer with staircase reflective element
- Patent number 9,207,122
- Issue date Dec 8, 2015
- Wayne State University
- Gregory Auner
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUSES, SYSTEMS, AND METHODS FOR DETECTING MATERIALS BASED ON...
- Publication number 20240230407
- Publication date Jul 11, 2024
- Wayne State University
- Gregory William Auner
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES, SYSTEMS, AND METHODS FOR DETECTING MATERIALS BASED ON...
- Publication number 20240133739
- Publication date Apr 25, 2024
- Wayne State University
- Gregory William Auner
- G01 - MEASURING TESTING
Information Patent Application
RAMAN-BASED SYSTEMS AND METHODS FOR MATERIAL IDENTIFICATION
- Publication number 20240060899
- Publication date Feb 22, 2024
- Wayne State University
- Ehsan MAJIDI
- G01 - MEASURING TESTING
Information Patent Application
RAPID ASSESSMENT DEVICE FOR RADIATION EXPOSURE
- Publication number 20210187502
- Publication date Jun 24, 2021
- VISCA, LLC
- Gregory W. AUNER
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
RAPID ASSESSMENT DEVICE FOR RADIATION EXPOSURE
- Publication number 20200261909
- Publication date Aug 20, 2020
- VISCA, LLC
- Gregory W. AUNER
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
APPARATUSES, SYSTEMS, AND METHODS FOR DETECTING MATERIALS BASED ON...
- Publication number 20200264050
- Publication date Aug 20, 2020
- Wayne State University
- Gregory William Auner
- G01 - MEASURING TESTING
Information Patent Application
DIFFERENTIAL ANGLE SENSOR
- Publication number 20200173813
- Publication date Jun 4, 2020
- China Automotive Systems, Inc.
- Haimian Cai
- G01 - MEASURING TESTING
Information Patent Application
TORQUE AND ANGULAR SENSOR
- Publication number 20180372513
- Publication date Dec 27, 2018
- China Automotive Systems, Inc.
- Haimian Cai
- G01 - MEASURING TESTING
Information Patent Application
STATIC INTERFEROMETER WITH STEP-STYLE REFLECTIVE ELEMENT
- Publication number 20150085284
- Publication date Mar 26, 2015
- Wayne State University
- Gregory W. Auner
- G01 - MEASURING TESTING
Information Patent Application
FOURIER-TRANSFORM INTERFEROMETER WITH STAIRCASE REFLECTIVE ELEMENT
- Publication number 20150029504
- Publication date Jan 29, 2015
- Wayne State University
- Gregory Auner
- G01 - MEASURING TESTING

Changhe Huang

Person

Patents Grantslast 30 patents

Apparatuses, systems, and methods for detecting materials based on...

Apparatuses, systems, and methods for detecting materials based on...

Rapid assessment device for radiation exposure

Differential angle sensor

Torque and angular sensor

Static interferometer with step-style reflective element

Fourier-transform interferometer with staircase reflective element

Patents Applicationslast 30 patents

APPARATUSES, SYSTEMS, AND METHODS FOR DETECTING MATERIALS BASED ON...

APPARATUSES, SYSTEMS, AND METHODS FOR DETECTING MATERIALS BASED ON...

RAMAN-BASED SYSTEMS AND METHODS FOR MATERIAL IDENTIFICATION

RAPID ASSESSMENT DEVICE FOR RADIATION EXPOSURE

RAPID ASSESSMENT DEVICE FOR RADIATION EXPOSURE

APPARATUSES, SYSTEMS, AND METHODS FOR DETECTING MATERIALS BASED ON...

DIFFERENTIAL ANGLE SENSOR

TORQUE AND ANGULAR SENSOR

STATIC INTERFEROMETER WITH STEP-STYLE REFLECTIVE ELEMENT

FOURIER-TRANSFORM INTERFEROMETER WITH STAIRCASE REFLECTIVE ELEMENT