Changho HAN

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Hwaseong-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit including test circuit and method of manufacturi...
- Patent number 12,000,888
- Issue date Jun 4, 2024
- Samsung Electronics Co., Ltd.
- Changho Han
- G01 - MEASURING TESTING
Information Patent Grant
Computer based system for verifying layout of semiconductor device...
- Patent number 10,095,825
- Issue date Oct 9, 2018
- Samsung Electronics Co., Ltd.
- Changho Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor having cross coupled structure and layout verificatio...
- Patent number 9,767,248
- Issue date Sep 19, 2017
- Samsung Electronics, Co., Ltd.
- Taejoong Song
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT INCLUDING TEST CIRCUIT AND METHOD OF MANUFACTURI...
- Publication number 20230049110
- Publication date Feb 16, 2023
- Samsung Electronics Co., Ltd.
- Changho Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR HAVING CROSS COUPLED STRUCTURE AND LAYOUT VERIFICATIO...
- Publication number 20160085904
- Publication date Mar 24, 2016
- Samsung Electronics Co., Ltd.
- Taejoong SONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPUTER BASED SYSTEM FOR VERIFYING LAYOUT OF SEMICONDUCTOR DEVICE...
- Publication number 20160085903
- Publication date Mar 24, 2016
- Samsung Electronics Co., Ltd.
- Changho HAN
- G06 - COMPUTING CALCULATING COUNTING