Changlin Wang

Person

Shanghai, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Optical structure
- Patent number 10,754,166
- Issue date Aug 25, 2020
- Mettler-Toledo Instruments (Shanghai) Co. Ltd
- Changlin Wang
- G02 - OPTICS
Information Patent Grant
Bubble level and apparatus containing a bubble level
- Patent number 9,631,925
- Issue date Apr 25, 2017
- Mettler-Toledo GmbH
- Changlin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring the electrical conductivity and/or...
- Patent number 8,521,442
- Issue date Aug 27, 2013
- Mettler-Toledo AG
- Changlin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for detecting failures in inductive conductivity...
- Patent number 8,508,234
- Issue date Aug 13, 2013
- Mettler-Toledo AG
- Changlin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for inductive conductivity measurements of a flui...
- Patent number 8,456,178
- Issue date Jun 4, 2013
- Mettler-Toledo AG
- Changlin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Input circuit for inductive measurements of the conductivity of a f...
- Patent number 8,451,007
- Issue date May 28, 2013
- Mettler-Toledo AG
- Fengjin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Measuring method and apparatus for potentiometric measuring probes
- Patent number 8,036,841
- Issue date Oct 11, 2011
- Mettler-Toledo AG
- Changlin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Temperature measurement device and measurement method
- Patent number 7,775,711
- Issue date Aug 17, 2010
- Mettler-Toledo AG
- Changlin Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
POWER ON/OFF CONTROL CIRCUIT AND ELECTRONIC DEVICE
- Publication number 20240258909
- Publication date Aug 1, 2024
- Mettler-Toledo Instruments (Shanghai) Co., Ltd.
- Yingzhen Tong
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SENSING DEVICE WITH A SEALING STRUCTURE
- Publication number 20240053275
- Publication date Feb 15, 2024
- Mettler-Toledo Instruments (Shanghai) Co., Ltd.
- Zhongjun Wang
- G01 - MEASURING TESTING
Information Patent Application
LOW-POWER ELECTRONIC PIPETTE
- Publication number 20210405080
- Publication date Dec 30, 2021
- Mettler-Toledo Instruments (Shanghai) Co. Ltd
- Jin Tang
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL STRUCTURE
- Publication number 20190355870
- Publication date Nov 21, 2019
- Mettler-Toledo Instruments (Shanghai) Co. Ltd
- Changlin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BUBBLE LEVEL AND APPARATUS CONTAINING A BUBBLE LEVEL
- Publication number 20160040989
- Publication date Feb 11, 2016
- METTLER-TOLEDO AG
- Changlin Wang
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR DETECTING FAILURES IN INDUCTIVE CONDUCTIVITY...
- Publication number 20110163756
- Publication date Jul 7, 2011
- METTLER-TOLEDO AG
- Changlin Wang
- G01 - MEASURING TESTING
Information Patent Application
INPUT CIRCUIT FOR INDUCTIVE MEASUREMENTS OF THE CONDUCTIVITY OF A F...
- Publication number 20110140716
- Publication date Jun 16, 2011
- METTLER-TOLEDO AG
- Fengjin Wang
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR INDUCTIVE CONDUCTIVITY MEASUREMENTS OF A FLUI...
- Publication number 20110140717
- Publication date Jun 16, 2011
- METTLER-TOLEDO AG
- Changlin Wang
- G01 - MEASURING TESTING
Information Patent Application
MEASURING METHOD AND APPARATUS FOR POTENTIOMETRIC MEASURING PROBES
- Publication number 20090157338
- Publication date Jun 18, 2009
- METTLER-TOLEDO AG
- Changlin WANG
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE MEASUREMENT DEVICE AND MEASUREMENT METHOD
- Publication number 20090122834
- Publication date May 14, 2009
- METTLER-TOLEDO AG
- Changlin WANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MEASURING THE ELECTRICAL CONDUCTIVITY AND/OR...
- Publication number 20090125250
- Publication date May 14, 2009
- METTLER-TOLEDO AG
- Changlin WANG
- G01 - MEASURING TESTING

Changlin Wang

Person

Patents Grantslast 30 patents

Optical structure

Bubble level and apparatus containing a bubble level

Method and device for measuring the electrical conductivity and/or...

Method and device for detecting failures in inductive conductivity...

Method and device for inductive conductivity measurements of a flui...

Input circuit for inductive measurements of the conductivity of a f...

Measuring method and apparatus for potentiometric measuring probes

Temperature measurement device and measurement method

Patents Applicationslast 30 patents

POWER ON/OFF CONTROL CIRCUIT AND ELECTRONIC DEVICE

SENSING DEVICE WITH A SEALING STRUCTURE

LOW-POWER ELECTRONIC PIPETTE

OPTICAL STRUCTURE

BUBBLE LEVEL AND APPARATUS CONTAINING A BUBBLE LEVEL

METHOD AND DEVICE FOR DETECTING FAILURES IN INDUCTIVE CONDUCTIVITY...

INPUT CIRCUIT FOR INDUCTIVE MEASUREMENTS OF THE CONDUCTIVITY OF A F...

METHOD AND DEVICE FOR INDUCTIVE CONDUCTIVITY MEASUREMENTS OF A FLUI...

MEASURING METHOD AND APPARATUS FOR POTENTIOMETRIC MEASURING PROBES

TEMPERATURE MEASUREMENT DEVICE AND MEASUREMENT METHOD

METHOD AND DEVICE FOR MEASURING THE ELECTRICAL CONDUCTIVITY AND/OR...