Changlin ZHAO

Person

Hubei, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for determining expansion compensation in phot...
- Patent number 11,264,242
- Issue date Mar 1, 2022
- Wuhan Xinxin Semiconductor Manufacturing Co., Ltd.
- Changlin Zhao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-wafer stack structure and forming method thereof
- Patent number 11,107,794
- Issue date Aug 31, 2021
- Wuhan Xinxin Semiconductor Manufacturing Co., Ltd.
- Changlin Zhao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with vertically separated openings and manufac...
- Patent number 11,043,448
- Issue date Jun 22, 2021
- Wuhan Xinxin Semiconductor Manufacturing Co., Ltd.
- Yu Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 10,943,853
- Issue date Mar 9, 2021
- Wuhan Xinxin Semiconductor Manufacturing Co., Ltd.
- Xing Hu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-wafer stacking structure and fabrication method thereof
- Patent number 10,867,969
- Issue date Dec 15, 2020
- Wuhan Xinxin Semiconductor Manufacturing Co., Ltd.
- Changlin Zhao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-wafer stacking structure and fabrication method thereof
- Patent number 10,784,163
- Issue date Sep 22, 2020
- Wuhan Xinxin Semiconductor Manufacturing Co., Ltd.
- Tian Zeng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-wafer stacking structure and fabrication method thereof
- Patent number 10,700,042
- Issue date Jun 30, 2020
- WUHAN XINXIN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Changlin Zhao
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method And Apparatus For Determining Expansion Compensation In Phot...
- Publication number 20210035805
- Publication date Feb 4, 2021
- Wuhan Xinxin Semiconductor Manufacturing Co., Ltd.
- Changlin ZHAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-WAFER STACKING STRUCTURE AND FABRICATION METHOD THEREOF
- Publication number 20200286861
- Publication date Sep 10, 2020
- WUHAN XINXIN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Changlin ZHAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-WAFER STACKING STRUCTURE AND FABRICATION METHOD THEREOF
- Publication number 20200075549
- Publication date Mar 5, 2020
- Wuhan Xinxin Semiconductor Manufacturing Co., Ltd.
- Changlin ZHAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20200075483
- Publication date Mar 5, 2020
- Wuhan Xinxin Semiconductor Manufacturing Co., Ltd.
- Yu Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-WAFER STACK STRUCTURE AND FORMING METHOD THEREOF
- Publication number 20200075552
- Publication date Mar 5, 2020
- Wuhan Xinxin Semiconductor Manufacturing Co., Ltd.
- Changlin ZHAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-WAFER STACKING STRUCTURE AND FABRICATION METHOD THEREOF
- Publication number 20200075411
- Publication date Mar 5, 2020
- WUHAN XINXIN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Tian ZENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20200075460
- Publication date Mar 5, 2020
- Wuhan Xinxin Semiconductor Manufacturing Co., Ltd.
- Xing Hu
- H01 - BASIC ELECTRIC ELEMENTS

Changlin ZHAO

Person

Patents Grantslast 30 patents

Method and apparatus for determining expansion compensation in phot...

Multi-wafer stack structure and forming method thereof

Semiconductor device with vertically separated openings and manufac...

Semiconductor device and manufacturing method thereof

Multi-wafer stacking structure and fabrication method thereof

Multi-wafer stacking structure and fabrication method thereof

Multi-wafer stacking structure and fabrication method thereof

Patents Applicationslast 30 patents

Method And Apparatus For Determining Expansion Compensation In Phot...

MULTI-WAFER STACKING STRUCTURE AND FABRICATION METHOD THEREOF

MULTI-WAFER STACKING STRUCTURE AND FABRICATION METHOD THEREOF

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

MULTI-WAFER STACK STRUCTURE AND FORMING METHOD THEREOF

MULTI-WAFER STACKING STRUCTURE AND FABRICATION METHOD THEREOF

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF