Changwook JEONG

Person

Hwaseong-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus with system verification based on reinforcemen...
- Patent number 12,175,177
- Issue date Dec 24, 2024
- Samsung Electronics Co., Ltd.
- Jun Haeng Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Simulation method for semiconductor fabrication process and method...
- Patent number 11,982,980
- Issue date May 14, 2024
- Samsung Electronics Co., Ltd.
- Jinwoo Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Simulation system for semiconductor process and simulation method t...
- Patent number 11,886,783
- Issue date Jan 30, 2024
- Samsung Electronics Co., Ltd.
- Sanghoon Myung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for modeling a semiconductor fabrication process
- Patent number 11,853,660
- Issue date Dec 26, 2023
- Samsung Electronics Co., Ltd.
- Hyunjoong Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-transitory computer-readable medium storing program code genera...
- Patent number 11,775,840
- Issue date Oct 3, 2023
- Samsung Electronics Co., Ltd.
- Wonik Jang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor wafer fault analysis system and operation method thereof
- Patent number 11,741,596
- Issue date Aug 29, 2023
- Samsung Electronics Co., Ltd.
- Min-Chul Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Proximity correction methods for semiconductor manufacturing processes
- Patent number 11,733,603
- Issue date Aug 22, 2023
- Samsung Electronics Co., Ltd.
- Taehoon Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic devices generating verification vector for verifying sem...
- Patent number 11,669,773
- Issue date Jun 6, 2023
- Samsung Electronics Co., Ltd.
- Seungju Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Simulation system for semiconductor process and simulation method t...
- Patent number 11,574,095
- Issue date Feb 7, 2023
- Samsung Electronics Co., Ltd.
- Sanghoon Myung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor fault analysis device and fault analysis method thereof
- Patent number 10,650,910
- Issue date May 12, 2020
- Samsung Electronics Co., Ltd.
- Changwook Jeong
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR MODELING A SEMICONDUCTOR FABRICATION PROCESS
- Publication number 20240086599
- Publication date Mar 14, 2024
- Samsung Electronics Co., Ltd.
- Hyunjoong Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR SIMULATING AND VERIFYING LAYOUT BASED ON DIST...
- Publication number 20230229841
- Publication date Jul 20, 2023
- Samsung Electronics Co., Ltd.
- Hyunjae JANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM PERFORMING PATTERN CLUSTERING
- Publication number 20230230348
- Publication date Jul 20, 2023
- Samsung Electronics Co., Ltd.
- IN HUH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPUTING DEVICE AND METHOD GENERATING OPTIMAL INPUT DATA
- Publication number 20230169240
- Publication date Jun 1, 2023
- Samsung Electronics Co., Ltd.
- JINWOO KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIMULATION SYSTEM FOR SEMICONDUCTOR PROCESS AND SIMULATION METHOD T...
- Publication number 20230142367
- Publication date May 11, 2023
- Samsung Electronics Co., Ltd.
- Sanghoon MYUNG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR THREE-DIMENSIONAL MODELING
- Publication number 20230136021
- Publication date May 4, 2023
- Samsung Electronics Co., Ltd.
- SANGHOON MYUNG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR GENERATING PROCESS SIMULATION MODELS
- Publication number 20230025626
- Publication date Jan 26, 2023
- Samsung Electronics Co., Ltd.
- SANGHOON MYUNG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA PROCESSING METHOD OF DETECTING AND RECOVERING MISSING VALUES,...
- Publication number 20220374498
- Publication date Nov 24, 2022
- Samsung Electronics Co., Ltd.
- Changwook JEONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR TRAINING STUDENT FRIENDLY TEACHER MODEL AND S...
- Publication number 20220207431
- Publication date Jun 30, 2022
- Samsung Electronics Co., Ltd.
- Daeyoung PARK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF PREDICTING SEMICONDUCTOR MATERIAL PROPERTIES AND METHOD O...
- Publication number 20220207393
- Publication date Jun 30, 2022
- Samsung Electronics Co., Ltd.
- Naoto Umezawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS OF GENERATING CIRCUIT MODELS AND MANUFACTURING INTEGRATED C...
- Publication number 20220121800
- Publication date Apr 21, 2022
- Samsung Electronics Co., Ltd.
- Yohan Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR MODELING A SEMICONDUCTOR FABRICATION PROCESS
- Publication number 20220092239
- Publication date Mar 24, 2022
- Samsung Electronics Co., Ltd.
- Hyunjoong Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIMULATION METHOD FOR SEMICONDUCTOR FABRICATION PROCESS AND METHOD...
- Publication number 20220043405
- Publication date Feb 10, 2022
- Samsung Electronics Co., Ltd.
- Jinwoo Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROXIMITY CORRECTION METHODS FOR SEMICONDUCTOR MANUFACTURING PROCESSES
- Publication number 20210405521
- Publication date Dec 30, 2021
- Samsung Electronics Co., Ltd.
- Taehoon Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPUTING DEVICE, OPERATING METHOD OF COMPUTING DEVICE, AND STORAGE...
- Publication number 20210174201
- Publication date Jun 10, 2021
- Samsung Electronics Co., Ltd.
- In HUH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NON-TRANSITORY COMPUTER-READABLE MEDIUM STORING PROGRAM CODE GENERA...
- Publication number 20210158173
- Publication date May 27, 2021
- Samsung Electronics Co., Ltd.
- Wonik JANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIMULATION SYSTEM FOR SEMICONDUCTOR PROCESS AND SIMULATION METHOD T...
- Publication number 20210158152
- Publication date May 27, 2021
- Samsung Electronics Co., Ltd.
- Sanghoon MYUNG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRONIC DEVICES GENERATING VERIFICATION VECTOR FOR VERIFYING SEM...
- Publication number 20210117193
- Publication date Apr 22, 2021
- Samsung Electronics Co., Ltd.
- Seungju Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR HYBRID MODEL INCLUDING MACHINE LEARNING MODEL...
- Publication number 20210056425
- Publication date Feb 25, 2021
- Samsung Electronics Co., Ltd.
- Changwook JEONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS WITH SYSTEM VERIFICATION BASED ON REINFORCEMEN...
- Publication number 20200364314
- Publication date Nov 19, 2020
- Samsung Electronics Co., Ltd.
- Jun Haeng LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR WAFER FAULT ANALYSIS SYSTEM AND OPERATION METHOD THEREOF
- Publication number 20200175665
- Publication date Jun 4, 2020
- Samsung Electronics Co., Ltd.
- Min-Chul PARK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR FAULT ANALYSIS DEVICE AND FAULT ANALYSIS METHOD THEREOF
- Publication number 20190385695
- Publication date Dec 19, 2019
- Samsung Electronics Co., Ltd.
- Changwook JEONG
- G01 - MEASURING TESTING

Changwook JEONG

Person

Patents Grantslast 30 patents

Method and apparatus with system verification based on reinforcemen...

Simulation method for semiconductor fabrication process and method...

Simulation system for semiconductor process and simulation method t...

System and method for modeling a semiconductor fabrication process

Non-transitory computer-readable medium storing program code genera...

Semiconductor wafer fault analysis system and operation method thereof

Proximity correction methods for semiconductor manufacturing processes

Electronic devices generating verification vector for verifying sem...

Simulation system for semiconductor process and simulation method t...

Semiconductor fault analysis device and fault analysis method thereof

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR MODELING A SEMICONDUCTOR FABRICATION PROCESS

METHOD AND SYSTEM FOR SIMULATING AND VERIFYING LAYOUT BASED ON DIST...

METHOD AND SYSTEM PERFORMING PATTERN CLUSTERING

COMPUTING DEVICE AND METHOD GENERATING OPTIMAL INPUT DATA

SIMULATION SYSTEM FOR SEMICONDUCTOR PROCESS AND SIMULATION METHOD T...

METHOD AND SYSTEM FOR THREE-DIMENSIONAL MODELING

METHOD AND APPARATUS FOR GENERATING PROCESS SIMULATION MODELS

DATA PROCESSING METHOD OF DETECTING AND RECOVERING MISSING VALUES,...

SYSTEM AND METHOD FOR TRAINING STUDENT FRIENDLY TEACHER MODEL AND S...

METHOD OF PREDICTING SEMICONDUCTOR MATERIAL PROPERTIES AND METHOD O...

METHODS OF GENERATING CIRCUIT MODELS AND MANUFACTURING INTEGRATED C...

SYSTEM AND METHOD FOR MODELING A SEMICONDUCTOR FABRICATION PROCESS

SIMULATION METHOD FOR SEMICONDUCTOR FABRICATION PROCESS AND METHOD...

PROXIMITY CORRECTION METHODS FOR SEMICONDUCTOR MANUFACTURING PROCESSES

COMPUTING DEVICE, OPERATING METHOD OF COMPUTING DEVICE, AND STORAGE...

NON-TRANSITORY COMPUTER-READABLE MEDIUM STORING PROGRAM CODE GENERA...

SIMULATION SYSTEM FOR SEMICONDUCTOR PROCESS AND SIMULATION METHOD T...

ELECTRONIC DEVICES GENERATING VERIFICATION VECTOR FOR VERIFYING SEM...

METHOD AND SYSTEM FOR HYBRID MODEL INCLUDING MACHINE LEARNING MODEL...

METHOD AND APPARATUS WITH SYSTEM VERIFICATION BASED ON REINFORCEMEN...

SEMICONDUCTOR WAFER FAULT ANALYSIS SYSTEM AND OPERATION METHOD THEREOF

SEMICONDUCTOR FAULT ANALYSIS DEVICE AND FAULT ANALYSIS METHOD THEREOF