Changze Liu

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Beijing, CN

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Patents Grantslast 30 patents

Information Patent Grant
Programmable array of silicon nanowire field effect transistor and...
- Patent number 9,099,500
- Issue date Aug 4, 2015
- Peking University
- Ru Huang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for testing density and location of gate dielectric layer tr...
- Patent number 9,018,968
- Issue date Apr 28, 2015
- Peking University
- Ru Huang
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing trap density of gate dielectric layer in semicon...
- Patent number 8,866,507
- Issue date Oct 21, 2014
- Peking University
- Ru Huang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR TESTING DENSITY AND LOCATION OF GATE DIELECTRIC LAYER TR...
- Publication number 20130214810
- Publication date Aug 22, 2013
- Peking University
- Ru Huang
- G01 - MEASURING TESTING
Information Patent Application
PROGRAMMABLE ARRAY OF SILICON NANOWIRE FIELD EFFECT TRANSISTOR AND...
- Publication number 20130075701
- Publication date Mar 28, 2013
- Peking University
- Ru Huang
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD FOR TESTING TRAP DENSITY OF GATE DIELECTRIC LAYER IN SEMICON...
- Publication number 20120187976
- Publication date Jul 26, 2012
- Peking University
- Ru Huang
- G01 - MEASURING TESTING