Chanmin Su

Person

Ventura, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Torsion wing probe assembly
- Patent number 11,555,827
- Issue date Jan 17, 2023
- Bruker Nano, Inc.
- Shuiqing Hu
- G01 - MEASURING TESTING
Information Patent Grant
Torsion wing probe assembly
- Patent number 11,119,118
- Issue date Sep 14, 2021
- Bruker Nano, Inc.
- Shuiqing Hu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 11,002,757
- Issue date May 11, 2021
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Infrared characterization of a sample using oscillating mode
- Patent number 10,845,382
- Issue date Nov 24, 2020
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of using peak force tapping mode to measure ph...
- Patent number 10,663,483
- Issue date May 26, 2020
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
Peakforce photothermal-based detection of IR nanoabsorption
- Patent number 10,520,426
- Issue date Dec 31, 2019
- Bruker Nano, Inc.
- Gregory O. Andreev
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 10,502,761
- Issue date Dec 10, 2019
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscopy utilizing separable components
- Patent number 10,345,337
- Issue date Jul 9, 2019
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 10,197,596
- Issue date Feb 5, 2019
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Dual-probe scanning probe microscope
- Patent number 10,197,595
- Issue date Feb 5, 2019
- Bruker Nano, Inc.
- Chanmin Su
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sample vessel retention structure for scanning probe microscope
- Patent number 10,175,263
- Issue date Jan 8, 2019
- Bruker Nano, Inc.
- Charles Meyer
- G02 - OPTICS
Information Patent Grant
Method and apparatus of using peak force tapping mode to measure ph...
- Patent number 9,995,765
- Issue date Jun 12, 2018
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
Chemical nano-identification of a sample using normalized near-fiel...
- Patent number 9,933,453
- Issue date Apr 3, 2018
- Bruker Nano, Inc.
- Gregory Andreev
- G01 - MEASURING TESTING
Information Patent Grant
Force measurement with real-time baseline determination
- Patent number 9,910,064
- Issue date Mar 6, 2018
- Bruker Nano, Inc.
- Changchun Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of electrical property measurement using an AF...
- Patent number 9,869,694
- Issue date Jan 16, 2018
- Bruker Nano, Inc.
- Chunzeng Li
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Chemical nano-identification of a sample using normalized near-fiel...
- Patent number 9,846,178
- Issue date Dec 19, 2017
- Bruker Nano, Inc.
- Gregory Andreev
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 9,810,713
- Issue date Nov 7, 2017
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus to compensate for deflection artifacts in an a...
- Patent number 9,739,799
- Issue date Aug 22, 2017
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
PeakForce photothermal-based detection of IR nanoabsorption
- Patent number 9,719,916
- Issue date Aug 1, 2017
- Bruker Nano, Inc.
- Gregory O. Andreev
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Miniaturized cantilever probe for scanning probe microscopy and fab...
- Patent number 9,709,597
- Issue date Jul 18, 2017
- Bruker Nano, Inc.
- Weijie Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 9,588,136
- Issue date Mar 7, 2017
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Force measurement with real-time baseline determination
- Patent number 9,575,090
- Issue date Feb 21, 2017
- Bruker Nano, Inc.
- Changchun Liu
- G01 - MEASURING TESTING
Information Patent Grant
Closed loop controller and method for fast scanning probe microscopy
- Patent number 9,523,707
- Issue date Dec 20, 2016
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Chemical nano-identification of a sample using normalized near-fiel...
- Patent number 9,448,252
- Issue date Sep 20, 2016
- BRUKER NANO, INCORPORATED
- Gregory Andreev
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 9,322,842
- Issue date Apr 26, 2016
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Dual-probe scanning probe microscope
- Patent number 9,291,639
- Issue date Mar 22, 2016
- Bruker Nano, Inc.
- Chanmin Su
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of using peak force tapping mode to measure ph...
- Patent number 9,291,640
- Issue date Mar 22, 2016
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 9,274,139
- Issue date Mar 1, 2016
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Closed loop controller and method for fast scanning probe microscopy
- Patent number 9,244,096
- Issue date Jan 26, 2016
- Bruke Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of electrical property measurement using an AF...
- Patent number 9,213,047
- Issue date Dec 15, 2015
- Bruker Nano, Inc.
- Chunzeng Li
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Nano-Mechanical Infrared Spectroscopy System and Method Using Gated...
- Publication number 20240168053
- Publication date May 23, 2024
- Bruker Nano, Inc.
- Martin Wagner
- G01 - MEASURING TESTING
Information Patent Application
Torsion Wing Probe Assembly
- Publication number 20220107339
- Publication date Apr 7, 2022
- Bruker Nano, Inc.
- Shuiqing Hu
- G01 - MEASURING TESTING
Information Patent Application
Device, and Method of Manufacture, for use in Mechanically Cleaning...
- Publication number 20210396784
- Publication date Dec 23, 2021
- Bruker Nano, Inc.
- Weijie Wang
- G01 - MEASURING TESTING
Information Patent Application
Torsion Wing Probe Assembly
- Publication number 20200348333
- Publication date Nov 5, 2020
- Bruke Nano, Inc.
- Shuiqing Hu
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20200191826
- Publication date Jun 18, 2020
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Application
SAMPLE VESSEL RETENTION STRUCTURE FOR SCANNING PROBE MICROSCOPE
- Publication number 20190212361
- Publication date Jul 11, 2019
- BRUKER NANO, INC.
- Charles MEYER
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...
- Publication number 20190018040
- Publication date Jan 17, 2019
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
Force Measurement with Real-Time Baseline Determination
- Publication number 20180299479
- Publication date Oct 18, 2018
- Bruker Nano, Inc.
- Changchun Liu
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPY UTILIZING SEPARABLE COMPONENTS
- Publication number 20180299481
- Publication date Oct 18, 2018
- BRUKER NANO, INC.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE VESSEL RETENTION STRUCTURE FOR SCANNING PROBE MICROSCOPE
- Publication number 20180188286
- Publication date Jul 5, 2018
- Bruker Nano, Inc.
- Charles MEYER
- G02 - OPTICS
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20180136251
- Publication date May 17, 2018
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Application
Peakforce Photothermal-Based Detection of IR Nanoabsorption
- Publication number 20180106715
- Publication date Apr 19, 2018
- Bruker Nano, Inc.
- Gregory O. Andreev
- B82 - NANO-TECHNOLOGY
Information Patent Application
CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIEL...
- Publication number 20180059136
- Publication date Mar 1, 2018
- BRUKER NANO, INC.
- Gregory Andreev
- G01 - MEASURING TESTING
Information Patent Application
Infrared Characterization of a Sample Using Oscillating Mode
- Publication number 20180052186
- Publication date Feb 22, 2018
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20170242052
- Publication date Aug 24, 2017
- Bruker Nano, Inc.
- Yan Hu
- G01 - MEASURING TESTING
Information Patent Application
Force Measurement with Real-Time Baseline Determination
- Publication number 20170227577
- Publication date Aug 10, 2017
- Bruker Nano, Inc.
- Changchun Liu
- G01 - MEASURING TESTING
Information Patent Application
PeakForce Photothermal-Based Detection of IR Nanoabsorption
- Publication number 20170052111
- Publication date Feb 23, 2017
- Bruker Nano, Inc.
- Gregory O. Andreev
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIEL...
- Publication number 20160356809
- Publication date Dec 8, 2016
- BRUKER NANO, INC.
- Gregory Andreev
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20160313367
- Publication date Oct 27, 2016
- Bruker Nano, Inc.
- Yan Hu
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...
- Publication number 20160274144
- Publication date Sep 22, 2016
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
Dual-Probe Scanning Probe Microscope
- Publication number 20160274143
- Publication date Sep 22, 2016
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
Closed Loop Controller and Method for Fast Scanning Probe Microscopy
- Publication number 20160266166
- Publication date Sep 15, 2016
- Bruker Nano, Inc.
- Jian Shi
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20160258979
- Publication date Sep 8, 2016
- Bruker Nano, Inc.
- Jian Shi
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Electrical Property Measurement Using an AF...
- Publication number 20160178659
- Publication date Jun 23, 2016
- Bruker Nano, Inc.
- Chunzeng Li
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Tuning a Scanning Probe Microscope
- Publication number 20160109477
- Publication date Apr 21, 2016
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Physical Property Measurement Using a Probe...
- Publication number 20160033547
- Publication date Feb 4, 2016
- Bruker Nano, Inc.
- Markus B. Raschke
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIEL...
- Publication number 20160018437
- Publication date Jan 21, 2016
- Bruker Nano, Inc.
- Gregory Andreev
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus to Compensate for Deflection Artifacts in an A...
- Publication number 20150247881
- Publication date Sep 3, 2015
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS OF TUNING A SCANNING PROBE MICROSCOPE
- Publication number 20150204902
- Publication date Jul 23, 2015
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
Closed Loop Controller and Method for Fast Scanning Probe Microscopy
- Publication number 20150198630
- Publication date Jul 16, 2015
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY

Person

Patents Grantslast 30 patents

Torsion wing probe assembly

Torsion wing probe assembly

Method and apparatus of operating a scanning probe microscope

Infrared characterization of a sample using oscillating mode

Method and apparatus of using peak force tapping mode to measure ph...

Peakforce photothermal-based detection of IR nanoabsorption

Method and apparatus of operating a scanning probe microscope

Scanning probe microscopy utilizing separable components

Method and apparatus of operating a scanning probe microscope

Dual-probe scanning probe microscope

Sample vessel retention structure for scanning probe microscope

Method and apparatus of using peak force tapping mode to measure ph...

Chemical nano-identification of a sample using normalized near-fiel...

Force measurement with real-time baseline determination

Method and apparatus of electrical property measurement using an AF...

Chemical nano-identification of a sample using normalized near-fiel...

Method and apparatus of operating a scanning probe microscope

Method and apparatus to compensate for deflection artifacts in an a...

PeakForce photothermal-based detection of IR nanoabsorption

Miniaturized cantilever probe for scanning probe microscopy and fab...

Method and apparatus of operating a scanning probe microscope

Force measurement with real-time baseline determination

Closed loop controller and method for fast scanning probe microscopy

Chemical nano-identification of a sample using normalized near-fiel...

Method and apparatus of operating a scanning probe microscope

Dual-probe scanning probe microscope

Method and apparatus of using peak force tapping mode to measure ph...

Method and apparatus of operating a scanning probe microscope

Closed loop controller and method for fast scanning probe microscopy

Method and apparatus of electrical property measurement using an AF...

Patents Applicationslast 30 patents

Nano-Mechanical Infrared Spectroscopy System and Method Using Gated...

Torsion Wing Probe Assembly

Device, and Method of Manufacture, for use in Mechanically Cleaning...

Torsion Wing Probe Assembly

Method and Apparatus of Operating a Scanning Probe Microscope

SAMPLE VESSEL RETENTION STRUCTURE FOR SCANNING PROBE MICROSCOPE

Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...

Force Measurement with Real-Time Baseline Determination

SCANNING PROBE MICROSCOPY UTILIZING SEPARABLE COMPONENTS

SAMPLE VESSEL RETENTION STRUCTURE FOR SCANNING PROBE MICROSCOPE

Method and Apparatus of Operating a Scanning Probe Microscope

Peakforce Photothermal-Based Detection of IR Nanoabsorption

CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIEL...

Infrared Characterization of a Sample Using Oscillating Mode

Method and Apparatus of Operating a Scanning Probe Microscope

Force Measurement with Real-Time Baseline Determination

PeakForce Photothermal-Based Detection of IR Nanoabsorption

CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIEL...

Method and Apparatus of Operating a Scanning Probe Microscope

Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...

Dual-Probe Scanning Probe Microscope

Closed Loop Controller and Method for Fast Scanning Probe Microscopy

Method and Apparatus of Operating a Scanning Probe Microscope

Method and Apparatus of Electrical Property Measurement Using an AF...

Method and Apparatus of Tuning a Scanning Probe Microscope

Method and Apparatus of Physical Property Measurement Using a Probe...

CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIEL...

Method and Apparatus to Compensate for Deflection Artifacts in an A...

METHOD AND APPARATUS OF TUNING A SCANNING PROBE MICROSCOPE

Closed Loop Controller and Method for Fast Scanning Probe Microscopy