Chao-Lung Lo

Person

Hsinchu, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Attribute-point-based timing constraint formal verification
- Patent number 11,900,035
- Issue date Feb 13, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chao-Chun Lo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit synthesis optimization for implements on integrated circuit
- Patent number 11,900,037
- Issue date Feb 13, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chao-Chun Lo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Attribute-point-based timing constraint formal verification
- Patent number 11,620,423
- Issue date Apr 4, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chao-Chun Lo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit synthesis optimization for implements on integrated circuit
- Patent number 11,347,920
- Issue date May 31, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chao-Chun Lo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Flare effect induced error correction
- Patent number 8,839,157
- Issue date Sep 16, 2014
- Macronix International Co., Ltd.
- Yi-Yien Tsai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for optical proximity correction of a modified in...
- Patent number 8,607,171
- Issue date Dec 10, 2013
- Macronix International Co., Ltd.
- Chungte Hsuan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for manufacturing openings on semiconductor devices
- Patent number 8,148,051
- Issue date Apr 3, 2012
- Macronix International Co., Ltd.
- Tzong-Hsien Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for designing mask pattern
- Patent number 8,015,512
- Issue date Sep 6, 2011
- Macronix International Co., Ltd.
- Chao-Lung Lo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of deriving etching correction values for patterns of photom...
- Patent number 7,875,198
- Issue date Jan 25, 2011
- Macronix International Co., Ltd.
- Chao-Lung Lo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Anti-aberration pattern and method for manufacturing the same
- Patent number 7,682,756
- Issue date Mar 23, 2010
- Macronix International Co., Ltd.
- Chao-Lung Lo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Controlling system and method for operating the same
- Patent number 7,632,616
- Issue date Dec 15, 2009
- Macronix International Co., Ltd.
- Chao-Lung Lo
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Attribute-Point-Based Timing Constraint Formal Verification
- Publication number 20240160820
- Publication date May 16, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chao-Chun Lo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Circuit Synthesis Optimization for Implements on Integrated Circuit
- Publication number 20240135078
- Publication date Apr 25, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chao-Chun Lo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Attribute-Point-Based Timing Constraint Formal Verification
- Publication number 20230205958
- Publication date Jun 29, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chao-Chun Lo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Circuit Synthesis Optimization for Implements on Integrated Circuit
- Publication number 20220284162
- Publication date Sep 8, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chao-Chun Lo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Circuit Synthesis Optimization for Implements on Integrated Circuit
- Publication number 20220121798
- Publication date Apr 21, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chao-Chun Lo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Attribute-Point-Based Timing Constraint Formal Verification
- Publication number 20220083717
- Publication date Mar 17, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Chao-Chun Lo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADVANCED CORRECTION METHOD
- Publication number 20150067619
- Publication date Mar 5, 2015
- Macronix International Co., Ltd.
- Chung-Te Hsuan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
FLARE EFFECT INDUCED ERROR CORRECTION
- Publication number 20140019919
- Publication date Jan 16, 2014
- Macronix International Co., Ltd.
- Yi-Yien TSAI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR MANUFACTURING A MASK
- Publication number 20140013286
- Publication date Jan 9, 2014
- Macronix International Co., Ltd.
- ChungTe HSUAN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM AND METHOD FOR OPTICAL PROXIMITY CORRECTION OF A MODIFIED IN...
- Publication number 20120272195
- Publication date Oct 25, 2012
- Macronix International Co., Ltd.
- Chungte Hsuan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR DESIGNING ASSISTANT PATTERN
- Publication number 20100279211
- Publication date Nov 4, 2010
- Macronix International Co., Ltd.
- Chao-Lung Lo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and System for Manufacturing Openings on Semiconductor Devices
- Publication number 20090314965
- Publication date Dec 24, 2009
- Macronix International Co., Ltd.
- Tzong Hsien Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF DERIVING ETCHING CORRECTION VALUES FOR PETTERNS OF PHOTOM...
- Publication number 20080124632
- Publication date May 29, 2008
- Macronix International Co., Ltd.
- CHAO-LUNG LO
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Anti-aberration pattern and method for manufacturing the same
- Publication number 20070160914
- Publication date Jul 12, 2007
- Chao-Lung Lo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CONTROLLING SYSTEM AND METHOD FOR OPERATING THE SAME
- Publication number 20070145005
- Publication date Jun 28, 2007
- Chao-Lung Lo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Chao-Lung Lo

Person

Patents Grantslast 30 patents

Attribute-point-based timing constraint formal verification

Circuit synthesis optimization for implements on integrated circuit

Attribute-point-based timing constraint formal verification

Circuit synthesis optimization for implements on integrated circuit

Flare effect induced error correction

System and method for optical proximity correction of a modified in...

Method and system for manufacturing openings on semiconductor devices

System for designing mask pattern

Method of deriving etching correction values for patterns of photom...

Anti-aberration pattern and method for manufacturing the same

Controlling system and method for operating the same

Patents Applicationslast 30 patents

Attribute-Point-Based Timing Constraint Formal Verification

Circuit Synthesis Optimization for Implements on Integrated Circuit

Attribute-Point-Based Timing Constraint Formal Verification

Circuit Synthesis Optimization for Implements on Integrated Circuit

Circuit Synthesis Optimization for Implements on Integrated Circuit

Attribute-Point-Based Timing Constraint Formal Verification

ADVANCED CORRECTION METHOD

FLARE EFFECT INDUCED ERROR CORRECTION

METHOD FOR MANUFACTURING A MASK

SYSTEM AND METHOD FOR OPTICAL PROXIMITY CORRECTION OF A MODIFIED IN...

METHOD FOR DESIGNING ASSISTANT PATTERN

Method and System for Manufacturing Openings on Semiconductor Devices

METHOD OF DERIVING ETCHING CORRECTION VALUES FOR PETTERNS OF PHOTOM...

Anti-aberration pattern and method for manufacturing the same

CONTROLLING SYSTEM AND METHOD FOR OPERATING THE SAME