Chao-Ping HSIEH

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Chu-Pei City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Integrated high-speed probe system
- Patent number 9,519,010
- Issue date Dec 13, 2016
- MPI CORPORATION
- Chun-Chi Wang
- G01 - MEASURING TESTING
Information Patent Grant
Integrated high-speed probe system
- Patent number 8,884,640
- Issue date Nov 11, 2014
- MPI Corporation
- Chun-Chi Wang
- G01 - MEASURING TESTING
Information Patent Grant
Probe card having adjustable high frequency signal transmission pat...
- Patent number 8,816,713
- Issue date Aug 26, 2014
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 8,542,027
- Issue date Sep 24, 2013
- MPI Corporation
- Young-Huang Chou
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED HIGH-SPEED PROBE SYSTEM
- Publication number 20150022227
- Publication date Jan 22, 2015
- MPI Corporation
- Chun-Chi WANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD HAVING ADJUSTABLE HIGH FREQUENCY SIGNAL TRANSMISSION PAT...
- Publication number 20130021053
- Publication date Jan 24, 2013
- Wei-Cheng KU
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED HIGH-SPEED PROBE SYSTEM
- Publication number 20120274347
- Publication date Nov 1, 2012
- Chun-Chi Wang
- G01 - MEASURING TESTING
Information Patent Application
High-frequency coupling testing device by coupling effect
- Publication number 20120242360
- Publication date Sep 27, 2012
- Keng-Yi Huang
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20100237886
- Publication date Sep 23, 2010
- MPI CORPORATION
- Young Huang Chou
- G01 - MEASURING TESTING