Chao-Yung Lai

Person

  • Miaoli County, TW

Patents Grantslast 30 patents

  • Information Patent Grant

    On-wafer AC stress test circuit

    • Patent number 7,589,551
    • Issue date Sep 15, 2009
    • United Microelectronics Corp.
    • Yun-Chi Yang
    • G01 - MEASURING TESTING