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Charalampos Zarkadas
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Almelo, NL
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Patents Grants
last 30 patents
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Patent Grant
Analysis of X-ray spectra using fitting
Patent number
11,210,366
Issue date
Dec 28, 2021
Malvern Panalytical B.V.
Charalampos Zarkadas
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Quantitative X-ray analysis—ratio correction
Patent number
9,851,313
Issue date
Dec 26, 2017
PANalytical B.V.
Waltherus Van Den Hoogenhof
G01 - MEASURING TESTING
Information
Patent Grant
Quantitative X-ray analysis—matrix thickness correction
Patent number
9,784,699
Issue date
Oct 10, 2017
PANalytical B.V.
Charalampos Zarkadas
G01 - MEASURING TESTING
Information
Patent Grant
Quantitative X-ray analysis—multi optical path instrument
Patent number
9,739,730
Issue date
Aug 22, 2017
PANalytical B.V.
Petronella Emerentiana Hegeman
G01 - MEASURING TESTING
Information
Patent Grant
Sample holder
Patent number
9,239,305
Issue date
Jan 19, 2016
PANalytical B.V.
Charalampos Zarkadas
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Analysis of X-ray spectra using fitting
Publication number
20190018824
Publication date
Jan 17, 2019
MALVERN PANALYTICAL B.V.
Charalampos ZARKADAS
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Quantitative X-ray Analysis - Ratio correction
Publication number
20160258889
Publication date
Sep 8, 2016
PANALYTICAL B.V.
Waltherus Van Den Hoogenhof
G01 - MEASURING TESTING
Information
Patent Application
Quantitative X-ray Analysis - Multi optical path instrument
Publication number
20160258892
Publication date
Sep 8, 2016
PANALYTICAL B.V.
Petronella Emerentiana Hegeman
G01 - MEASURING TESTING
Information
Patent Application
Quantitative X-ray Analysis - Matrix thickness correction
Publication number
20160258890
Publication date
Sep 8, 2016
PANALYTICAL B.V.
Charalampos Zarkadas
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE HOLDER
Publication number
20140146940
Publication date
May 29, 2014
PANALYTICAL B.V.
Charalampos Zarkadas
G01 - MEASURING TESTING