Charles A. Miller

Person

People

Patents Grantslast 30 patents

Information Patent Grant
High performance probe system
- Patent number 8,614,590
- Issue date Dec 24, 2013
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Method of designing an application specific probe card test system
- Patent number 8,581,610
- Issue date Nov 12, 2013
- Charles A Miller
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method of testing singulated dies
- Patent number 8,513,969
- Issue date Aug 20, 2013
- FormFactor, Inc.
- Thomas H. Dozier
- G01 - MEASURING TESTING
Information Patent Grant
Stacked die module
- Patent number 8,324,725
- Issue date Dec 4, 2012
- FormFactor, Inc.
- Igor Y. Khandros
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for terminating a test signal applied to multi...
- Patent number 8,098,076
- Issue date Jan 17, 2012
- FormFactor, Inc.
- Guang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method of expanding tester drive and measurement capability
- Patent number 8,067,951
- Issue date Nov 29, 2011
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Calibration substrate
- Patent number 7,994,803
- Issue date Aug 9, 2011
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Bi-directional buffer for interfacing test system channel
- Patent number 7,977,958
- Issue date Jul 12, 2011
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Closed-grid bus architecture for wafer interconnect structure
- Patent number 7,960,990
- Issue date Jun 14, 2011
- FormFactor, Inc.
- Charles A. Miller
- G11 - INFORMATION STORAGE
Information Patent Grant
AC coupled parameteric test probe
- Patent number 7,952,375
- Issue date May 31, 2011
- FormFactor, Inc.
- Benjamin N Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Contactless interfacing of test signals with a device under test
- Patent number 7,928,750
- Issue date Apr 19, 2011
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetically coupled interconnect system architecture
- Patent number 7,889,022
- Issue date Feb 15, 2011
- FormFactor, Inc.
- Charles A. Miller
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for increasing operating frequency of a system...
- Patent number 7,880,486
- Issue date Feb 1, 2011
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Probe card cooling assembly with direct cooling of active electroni...
- Patent number 7,863,915
- Issue date Jan 4, 2011
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for remotely buffering test channels
- Patent number 7,825,652
- Issue date Nov 2, 2010
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Test system with wireless communications
- Patent number 7,821,255
- Issue date Oct 26, 2010
- FormFactor, Inc.
- Igor Y. Khandros
- G01 - MEASURING TESTING
Information Patent Grant
Electronic package with direct cooling of active electronic components
- Patent number 7,768,777
- Issue date Aug 3, 2010
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Grant
High performance probe system
- Patent number 7,764,075
- Issue date Jul 27, 2010
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Efficient wired interface for differential signals
- Patent number 7,746,937
- Issue date Jun 29, 2010
- FormFactor, Inc.
- Charles A. Miller
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus and method of testing singulated dies
- Patent number 7,733,106
- Issue date Jun 8, 2010
- FormFactor, Inc.
- Thomas H. Dozier, II
- G01 - MEASURING TESTING
Information Patent Grant
Predictive, adaptive power supply for an integrated circuit under test
- Patent number 7,714,603
- Issue date May 11, 2010
- FormFactor, Inc.
- Benjamin N. Eldridge
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High density planar electrical interface
- Patent number 7,699,616
- Issue date Apr 20, 2010
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Test method for yielding a known good die
- Patent number 7,694,246
- Issue date Apr 6, 2010
- FormFactor, Inc.
- Charles A. Miller
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for interconnecting an integrated circuit multiple die assembly
- Patent number 7,681,309
- Issue date Mar 23, 2010
- FormFactor, Inc.
- Charles A. Miller
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Adjustable delay transmission line
- Patent number 7,683,738
- Issue date Mar 23, 2010
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Wireless test system
- Patent number 7,675,311
- Issue date Mar 9, 2010
- FormFactor, Inc.
- Igor Y. Khandros
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetically coupled interconnect system architecture
- Patent number 7,612,630
- Issue date Nov 3, 2009
- FormFactor, Inc.
- Charles A. Miller
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Voltage fault detection and protection
- Patent number 7,609,080
- Issue date Oct 27, 2009
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for calibrating and/or deskewing communication...
- Patent number 7,595,629
- Issue date Sep 29, 2009
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Isolation buffers with controlled equal time delays
- Patent number 7,586,300
- Issue date Sep 8, 2009
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Integrated circuit tester with high bandwidth probe assembly
- Publication number 20110115512
- Publication date May 19, 2011
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
HIGH PERFORMANCE PROBE SYSTEM
- Publication number 20110025361
- Publication date Feb 3, 2011
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
CLOSED-GRID BUS ARCHITECTURE FOR WAFER INTERCONNECT STRUCTURE
- Publication number 20100264947
- Publication date Oct 21, 2010
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for Terminating A Test Signal Applied To Multi...
- Publication number 20100253374
- Publication date Oct 7, 2010
- FormFactor, Inc.
- Guang Chen
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD OF TESTING SINGULATED DIES
- Publication number 20100244873
- Publication date Sep 30, 2010
- FormFactor, Inc.
- Thomas H. Dozier, II
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD COOLING ASSEMBLY WITH DIRECT COOLING OF ACTIVE ELECTRONI...
- Publication number 20100052714
- Publication date Mar 4, 2010
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETICALLY COUPLED INTERCONNECT SYSTEM ARCHITECTURE
- Publication number 20100045407
- Publication date Feb 25, 2010
- FormFactor, Inc.
- Charles A. Miller
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
VOLTAGE FAULT DETECTION AND PROTECTION
- Publication number 20100039739
- Publication date Feb 18, 2010
- FormFactor, Inc.
- Bruce J. Barbara
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CALIBRATING AND/OR DESKEWING COMMUNICATION...
- Publication number 20100017662
- Publication date Jan 21, 2010
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EXPANDING TESTER DRIVE AND MEASUREMENT CAPABILITY
- Publication number 20090267627
- Publication date Oct 29, 2009
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
Wireless Test Cassette
- Publication number 20090251162
- Publication date Oct 8, 2009
- FormFactor, Inc.
- Igor Y. Khandros
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ESTIMATING CHANNEL BANDWIDTH FROM A TIME DOMAIN REFLECTOM...
- Publication number 20090212790
- Publication date Aug 27, 2009
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
CLOSED-GRID BUS ARCHITECTURE FOR WAFER INTERCONNECT STRUCTURE
- Publication number 20090179659
- Publication date Jul 16, 2009
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
HIGH PERFORMANCE PROBE SYSTEM
- Publication number 20090134895
- Publication date May 28, 2009
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR REMOTELY BUFFERING TEST CHANNELS
- Publication number 20090132190
- Publication date May 21, 2009
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
CONTACTLESS INTERFACING OF TEST SIGNALS WITH A DEVICE UNDER TEST
- Publication number 20090102494
- Publication date Apr 23, 2009
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
Electronic Package With Direct Cooling Of Active Electronic Components
- Publication number 20090032938
- Publication date Feb 5, 2009
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus For Increasing Operating Frequency Of A System...
- Publication number 20080303541
- Publication date Dec 11, 2008
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
ISOLATION BUFFERS WITH CONTROLLED EQUAL TIME DELAYS
- Publication number 20080191722
- Publication date Aug 14, 2008
- FormFactor, Inc.
- Charles A. Miller
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Probing Structure With Fine Pitch Probes
- Publication number 20080174328
- Publication date Jul 24, 2008
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
HIGH DENSITY PLANAR ELECTRICAL INTERFACE
- Publication number 20080150571
- Publication date Jun 26, 2008
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
Intelligent probe card architecture
- Publication number 20080100320
- Publication date May 1, 2008
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
ATTACHING AND INTERCONNECTING DIES TO A SUBSTRATE
- Publication number 20080088030
- Publication date Apr 17, 2008
- FormFactor, Inc.
- Benjamin N. Eldridge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CLOSED-GRID BUS ARCHITECTURE FOR WAFER INTERCONNECT STRUCTURE
- Publication number 20080024143
- Publication date Jan 31, 2008
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
TESTER CHANNEL TO MULTIPLE IC TERMINALS
- Publication number 20080010814
- Publication date Jan 17, 2008
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
Method of Expanding Tester Drive and Measurement Capability
- Publication number 20070296422
- Publication date Dec 27, 2007
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
AC coupled parameteric test probe
- Publication number 20070296435
- Publication date Dec 27, 2007
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Bi-Directional Buffer For Interfacing Test System Channel
- Publication number 20070290676
- Publication date Dec 20, 2007
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
Adjustable Delay Transmission Line
- Publication number 20070279151
- Publication date Dec 6, 2007
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
PREDICTIVE, ADAPTIVE POWER SUPPLY FOR AN INTEGRATED CIRCUIT UNDER TEST
- Publication number 20070257696
- Publication date Nov 8, 2007
- FormFactor, Inc.
- Benjamin N. Eldridge
- G06 - COMPUTING CALCULATING COUNTING

Charles A. Miller

Person

Patents Grantslast 30 patents

High performance probe system

Method of designing an application specific probe card test system

Apparatus and method of testing singulated dies

Stacked die module

Method and apparatus for terminating a test signal applied to multi...

Method of expanding tester drive and measurement capability

Calibration substrate

Bi-directional buffer for interfacing test system channel

Closed-grid bus architecture for wafer interconnect structure

AC coupled parameteric test probe

Contactless interfacing of test signals with a device under test

Electromagnetically coupled interconnect system architecture

Method and apparatus for increasing operating frequency of a system...

Probe card cooling assembly with direct cooling of active electroni...

Method and apparatus for remotely buffering test channels

Test system with wireless communications

Electronic package with direct cooling of active electronic components

High performance probe system

Efficient wired interface for differential signals

Apparatus and method of testing singulated dies

Predictive, adaptive power supply for an integrated circuit under test

High density planar electrical interface

Test method for yielding a known good die

Method for interconnecting an integrated circuit multiple die assembly

Adjustable delay transmission line

Wireless test system

Electromagnetically coupled interconnect system architecture

Voltage fault detection and protection

Method and apparatus for calibrating and/or deskewing communication...

Isolation buffers with controlled equal time delays

Patents Applicationslast 30 patents

Integrated circuit tester with high bandwidth probe assembly

HIGH PERFORMANCE PROBE SYSTEM

CLOSED-GRID BUS ARCHITECTURE FOR WAFER INTERCONNECT STRUCTURE

Method and apparatus for Terminating A Test Signal Applied To Multi...

APPARATUS AND METHOD OF TESTING SINGULATED DIES

PROBE CARD COOLING ASSEMBLY WITH DIRECT COOLING OF ACTIVE ELECTRONI...

ELECTROMAGNETICALLY COUPLED INTERCONNECT SYSTEM ARCHITECTURE

VOLTAGE FAULT DETECTION AND PROTECTION

METHOD AND APPARATUS FOR CALIBRATING AND/OR DESKEWING COMMUNICATION...

METHOD OF EXPANDING TESTER DRIVE AND MEASUREMENT CAPABILITY

Wireless Test Cassette

METHOD OF ESTIMATING CHANNEL BANDWIDTH FROM A TIME DOMAIN REFLECTOM...

CLOSED-GRID BUS ARCHITECTURE FOR WAFER INTERCONNECT STRUCTURE

HIGH PERFORMANCE PROBE SYSTEM

METHOD AND APPARATUS FOR REMOTELY BUFFERING TEST CHANNELS

CONTACTLESS INTERFACING OF TEST SIGNALS WITH A DEVICE UNDER TEST

Electronic Package With Direct Cooling Of Active Electronic Components

Method and Apparatus For Increasing Operating Frequency Of A System...

ISOLATION BUFFERS WITH CONTROLLED EQUAL TIME DELAYS

Probing Structure With Fine Pitch Probes

HIGH DENSITY PLANAR ELECTRICAL INTERFACE

Intelligent probe card architecture

ATTACHING AND INTERCONNECTING DIES TO A SUBSTRATE

CLOSED-GRID BUS ARCHITECTURE FOR WAFER INTERCONNECT STRUCTURE

TESTER CHANNEL TO MULTIPLE IC TERMINALS

Method of Expanding Tester Drive and Measurement Capability

AC coupled parameteric test probe

Bi-Directional Buffer For Interfacing Test System Channel

Adjustable Delay Transmission Line

PREDICTIVE, ADAPTIVE POWER SUPPLY FOR AN INTEGRATED CIRCUIT UNDER TEST