Charles Amsden

Person

Mountain View, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Laser marking focus feedback system having an intensity indication...
- Patent number 10,916,462
- Issue date Feb 9, 2021
- KLA-Tencor Corporation
- Timothy Russin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical interconnect for switch applications
- Patent number 10,890,719
- Issue date Jan 12, 2021
- T&S COMMUNICATIONS CO., LTD.
- John Heanue
- G02 - OPTICS
Information Patent Grant
Optical interconnect having optical splitters and modulators integr...
- Patent number 10,178,452
- Issue date Jan 8, 2019
- Kaiam Corp.
- Bardia Pezeshki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Defect marking for semiconductor wafer inspection
- Patent number 10,082,470
- Issue date Sep 25, 2018
- KLA-Tencor Corporation
- David Shortt
- G01 - MEASURING TESTING
Information Patent Grant
Large particle detection for multi-spot surface scanning inspection...
- Patent number 8,755,044
- Issue date Jun 17, 2014
- KLA-Tencor Corporation
- Juergen Reich
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL INTERCONNECT FOR SWITCH APPLICATIONS
- Publication number 20220019038
- Publication date Jan 20, 2022
- T&S Communications Co. Ltd.
- John Heanue
- G02 - OPTICS
Information Patent Application
OPTICAL INTERCONNECT FOR SWITCH APPLICATIONS
- Publication number 20200355871
- Publication date Nov 12, 2020
- T&S Communications Co. Ltd.
- John Heanue
- G02 - OPTICS
Information Patent Application
OPTICAL INTERCONNECT FOR SWITCH APPLICATIONS
- Publication number 20190235186
- Publication date Aug 1, 2019
- Kaiam Corp.
- John Heanue
- G02 - OPTICS
Information Patent Application
LASER MARKING FOCUS FEEDBACK SYSTEM
- Publication number 20190122912
- Publication date Apr 25, 2019
- KLA-Tencor Corporation
- Timothy Russin
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INTERCONNECT FOR SWITCH APPLICATIONS
- Publication number 20190072720
- Publication date Mar 7, 2019
- Kaiam Corp.
- John Heanue
- G02 - OPTICS
Information Patent Application
Defect Marking For Semiconductor Wafer Inspection
- Publication number 20180088056
- Publication date Mar 29, 2018
- KLA-Tencor Corporation
- David Shortt
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INTERCONNECT HAVING OPTICAL SPLITTERS AND MODULATORS INTEGR...
- Publication number 20170272845
- Publication date Sep 21, 2017
- Kaiam Corp.
- Bardia Pezeshki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
OPTICAL INTERCONNECT FOR SWITCH APPLICATIONS
- Publication number 20170139145
- Publication date May 18, 2017
- Kaiam Corp.
- John Heanue
- G02 - OPTICS
Information Patent Application
OPTICAL INTERCONNECT FOR SWITCH APPLICATIONS
- Publication number 20160381442
- Publication date Dec 29, 2016
- Kaiam Corp.
- John Heanue
- G02 - OPTICS
Information Patent Application
Large Particle Detection For Multi-Spot Surface Scanning Inspection...
- Publication number 20130050689
- Publication date Feb 28, 2013
- KLA-Tencor Corporation
- Juergen Reich
- G01 - MEASURING TESTING

Charles Amsden

Person

Patents Grantslast 30 patents

Laser marking focus feedback system having an intensity indication...

Optical interconnect for switch applications

Optical interconnect having optical splitters and modulators integr...

Defect marking for semiconductor wafer inspection

Large particle detection for multi-spot surface scanning inspection...

Patents Applicationslast 30 patents

OPTICAL INTERCONNECT FOR SWITCH APPLICATIONS

OPTICAL INTERCONNECT FOR SWITCH APPLICATIONS

OPTICAL INTERCONNECT FOR SWITCH APPLICATIONS

LASER MARKING FOCUS FEEDBACK SYSTEM

OPTICAL INTERCONNECT FOR SWITCH APPLICATIONS

Defect Marking For Semiconductor Wafer Inspection

OPTICAL INTERCONNECT HAVING OPTICAL SPLITTERS AND MODULATORS INTEGR...

OPTICAL INTERCONNECT FOR SWITCH APPLICATIONS

OPTICAL INTERCONNECT FOR SWITCH APPLICATIONS

Large Particle Detection For Multi-Spot Surface Scanning Inspection...