Charles B. LaRow

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Burlington, VT, US

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Patents Applicationslast 30 patents

Information Patent Application
MEASURING DIELECTRIC BREAKDOWN IN A DYNAMIC MODE
- Publication number 20140195175
- Publication date Jul 10, 2014
- International Business Machines Corporation
- Eduard A. Cartier
- G01 - MEASURING TESTING
Information Patent Application
Dual Stage Voltage Ramp Stress Test for Gate Dielectrics
- Publication number 20120187974
- Publication date Jul 26, 2012
- International Business Machines Corporation
- David G. Brochu, JR.
- G01 - MEASURING TESTING