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Charles E. Wayman
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San Jose, CA, US
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last 30 patents
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Patent Grant
Slit confocal autofocus system
Patent number
7,142,315
Issue date
Nov 28, 2006
KLA-Tencor Technologies Corporation
Steve R. Lange
G01 - MEASURING TESTING
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Patent Grant
Surface inspection system with misregistration error correction and...
Patent number
5,825,482
Issue date
Oct 20, 1998
KLA-Tencor Corporation
Mehrdad Nikoonahad
G01 - MEASURING TESTING