CHARLES GREGORY POTTER SR.

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and systems of optical inspection of electronic device manu...
- Patent number 12,215,966
- Issue date Feb 4, 2025
- Applied Materials, Inc.
- Mohsin Waqar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for measuring erosion and calibrating position...
- Patent number 11,978,647
- Issue date May 7, 2024
- Applied Materials, Inc.
- Charles G. Potter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for measuring placement of a substrate on a he...
- Patent number 11,908,724
- Issue date Feb 20, 2024
- Applied Materials, Inc.
- Charles G. Potter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for measuring erosion and calibrating position...
- Patent number 11,521,872
- Issue date Dec 6, 2022
- Applied Materials, Inc.
- Charles G. Potter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for measuring placement of a substrate on a he...
- Patent number 11,404,296
- Issue date Aug 2, 2022
- Applied Materials, Inc.
- Charles G. Potter
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Method and apparatus for measuring wafer movement and placement usi...
- Patent number 11,342,210
- Issue date May 24, 2022
- Applied Materials, Inc.
- Charles G. Potter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for direct measurement of chucking force on an...
- Patent number 11,054,317
- Issue date Jul 6, 2021
- Applied Materials, Inc.
- Charles G. Potter
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring process kit centering
- Patent number 10,847,393
- Issue date Nov 24, 2020
- Applied Materials, Inc.
- Charles G. Potter
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Long range capacitive gap measurement in a wafer form sensor system
- Patent number 10,794,681
- Issue date Oct 6, 2020
- Applied Materials, Inc.
- Charles G. Potter
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Method and apparatus for determining substrate placement in a proce...
- Patent number 10,522,380
- Issue date Dec 31, 2019
- Applied Materials, Inc.
- Charles Gregory Potter
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR MEASURING EROSION AND CALIBRATING POSITION...
- Publication number 20230052210
- Publication date Feb 16, 2023
- Applied Materials, Inc.
- Charles G. Potter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR MEASURING PLACEMENT OF A SUBSTRATE ON A HE...
- Publication number 20220319887
- Publication date Oct 6, 2022
- Applied Materials, Inc.
- Charles G. Potter
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
METHODS AND SYSTEMS OF OPTICAL INSPECTION OF ELECTRONIC DEVICE MANU...
- Publication number 20210172728
- Publication date Jun 10, 2021
- Applied Materials, Inc.
- Mohsin Waqar
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING PROCESS KIT CENTERING
- Publication number 20210035832
- Publication date Feb 4, 2021
- Charles Potter
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
METHOD AND APPARATUS FOR DIRECT MEASUREMENT OF CHUCKING FORCE ON AN...
- Publication number 20200103294
- Publication date Apr 2, 2020
- Applied Materials, Inc.
- Charles G. Potter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LONG RANGE CAPACITIVE GAP MEASUREMENT IN A WAFER FORM SENSOR SYSTEM
- Publication number 20200072594
- Publication date Mar 5, 2020
- Applied Materials, Inc.
- Charles G. POTTER
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING WAFER MOVEMENT AND PLACEMENT USI...
- Publication number 20200075369
- Publication date Mar 5, 2020
- Applied Materials, Inc.
- Charles G. Potter
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING PROCESS KIT CENTERING
- Publication number 20200075368
- Publication date Mar 5, 2020
- Applied Materials, Inc.
- Charles G. POTTER
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING PLACEMENT OF A SUBSTRATE ON A HE...
- Publication number 20200075370
- Publication date Mar 5, 2020
- Applied Materials, Inc.
- Charles G. Potter
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
METHOD AND APPARATUS FOR MEASURING EROSION AND CALIBRATING POSITION...
- Publication number 20200075367
- Publication date Mar 5, 2020
- Applied Materials, Inc.
- Charles G. Potter
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING SUBSTRATE PLACEMENT IN A PROCE...
- Publication number 20150369583
- Publication date Dec 24, 2015
- Applied Materials, Inc.
- CHARLES GREGORY POTTER
- G01 - MEASURING TESTING

CHARLES GREGORY POTTER SR.

Person

Patents Grantslast 30 patents

Methods and systems of optical inspection of electronic device manu...

Method and apparatus for measuring erosion and calibrating position...

Method and apparatus for measuring placement of a substrate on a he...

Method and apparatus for measuring erosion and calibrating position...

Method and apparatus for measuring placement of a substrate on a he...

Method and apparatus for measuring wafer movement and placement usi...

Method and apparatus for direct measurement of chucking force on an...

Method and apparatus for measuring process kit centering

Long range capacitive gap measurement in a wafer form sensor system

Method and apparatus for determining substrate placement in a proce...

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR MEASURING EROSION AND CALIBRATING POSITION...

METHOD AND APPARATUS FOR MEASURING PLACEMENT OF A SUBSTRATE ON A HE...

METHODS AND SYSTEMS OF OPTICAL INSPECTION OF ELECTRONIC DEVICE MANU...

METHOD AND APPARATUS FOR MEASURING PROCESS KIT CENTERING

METHOD AND APPARATUS FOR DIRECT MEASUREMENT OF CHUCKING FORCE ON AN...

LONG RANGE CAPACITIVE GAP MEASUREMENT IN A WAFER FORM SENSOR SYSTEM

METHOD AND APPARATUS FOR MEASURING WAFER MOVEMENT AND PLACEMENT USI...

METHOD AND APPARATUS FOR MEASURING PROCESS KIT CENTERING

METHOD AND APPARATUS FOR MEASURING PLACEMENT OF A SUBSTRATE ON A HE...

METHOD AND APPARATUS FOR MEASURING EROSION AND CALIBRATING POSITION...

METHOD AND APPARATUS FOR DETERMINING SUBSTRATE PLACEMENT IN A PROCE...