Charles J. Montrose

Person

Clintondale, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Voltage-driven intelligent characterization bench for semiconductor
- Patent number 9,772,371
- Issue date Sep 26, 2017
- GLOBALFOUNDRIES Inc.
- Charles J. Montrose
- G01 - MEASURING TESTING
Information Patent Grant
Memory tester design for soft error rate (SER) failure analysis
- Patent number 9,460,814
- Issue date Oct 4, 2016
- GLOBALFOUNDRIES Inc.
- Joshua M. Dragula
- G11 - INFORMATION STORAGE
Information Patent Grant
Voltage-driven intelligent characterization bench for semiconductor
- Patent number 9,043,179
- Issue date May 26, 2015
- International Business Machines Corporation
- Charles J. Montrose
- G01 - MEASURING TESTING
Information Patent Grant
Radiation hardened memory cell and design structures
- Patent number 9,006,827
- Issue date Apr 14, 2015
- International Business Machines Corporation
- John G. Massey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Voltage driver for a voltage-driven intelligent characterization be...
- Patent number 8,615,373
- Issue date Dec 24, 2013
- International Business Machines Corporation
- Charles J. Montrose
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for accurate and efficient quality and reliability evalua...
- Patent number 7,602,265
- Issue date Oct 13, 2009
- International Business Machines Corporation
- Hariklia Deligianni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for testing a micro electromechanical device
- Patent number 6,940,285
- Issue date Sep 6, 2005
- International Business Machines Corporation
- Charles J. Montrose
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Stress testing for semiconductor devices
- Patent number 6,611,146
- Issue date Aug 26, 2003
- International Business Machines Corporation
- Charles J. Montrose
- G01 - MEASURING TESTING
Information Patent Grant
Electromigration and extrusion monitor and control system
- Patent number 6,598,182
- Issue date Jul 22, 2003
- International Business Machines Corporation
- Nicholas J. Lowitz
- G01 - MEASURING TESTING
Information Patent Grant
Circuit for bipolar transistor stress and qualification
- Patent number 6,437,956
- Issue date Aug 20, 2002
- International Business Machines Corporation
- Charles J. Montrose
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for characterization of gate dielectrics
- Patent number 6,429,677
- Issue date Aug 6, 2002
- International Business Machines Corporation
- Charles Montrose
- G01 - MEASURING TESTING
Information Patent Grant
Power booster and current measuring unit
- Patent number 6,429,641
- Issue date Aug 6, 2002
- International Business Machines Corporation
- Charles J. Montrose
- G01 - MEASURING TESTING
Information Patent Grant
System and method for diagnosing mechanical clocks
- Patent number 6,036,358
- Issue date Mar 14, 2000
- International Business Machines Corporation
- Charles J. Montrose
- G04 - HOROLOGY

Patents Applicationslast 30 patents

Information Patent Application
MEMORY TESTER DESIGN FOR SOFT ERROR RATE (SER) FAILURE ANALYSIS
- Publication number 20150318059
- Publication date Nov 5, 2015
- International Business Machines Corporation
- Joshua M. Dragula
- G11 - INFORMATION STORAGE
Information Patent Application
VOLTAGE-DRIVEN INTELLIGENT CHARACTERIZATION BENCH FOR SEMICONDUCTOR
- Publication number 20150185277
- Publication date Jul 2, 2015
- International Business Machines Corporation
- Charles J. Montrose
- G01 - MEASURING TESTING
Information Patent Application
RADIATION HARDENED MEMORY CELL AND DESIGN STRUCTURES
- Publication number 20130113043
- Publication date May 9, 2013
- International Business Machines Corporation
- John G. MASSEY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VOLTAGE-DRIVEN INTELLIGENT CHARACTERIZATION BENCH FOR SEMICONDUCTOR
- Publication number 20120179409
- Publication date Jul 12, 2012
- International Business Machines Corporation
- Charles J. Montrose
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INFORMATION TRANSFER IN A VOLTAGE-DRIVEN INTELLIGENT CHA...
- Publication number 20120179943
- Publication date Jul 12, 2012
- International Business Machines Corporation
- Charles J. Montrose
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VOLTAGE DRIVER FOR A VOLTAGE-DRIVEN INTELLIGENT CHARACTERIZATION BE...
- Publication number 20120179410
- Publication date Jul 12, 2012
- International Business Machines Corporation
- Charles J. Montrose
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR ACCURATE AND EFFICIENT QUALITY AND RELIABILITY EVALUA...
- Publication number 20070090902
- Publication date Apr 26, 2007
- International Business Machines Corporation
- Hariklia Deligianni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR TESTING A MICRO ELECTROMECHANICAL DEVICE
- Publication number 20040257086
- Publication date Dec 23, 2004
- International Business Machines Corporation
- Charles J. Montrose
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Stress testing for semiconductor devices
- Publication number 20030001585
- Publication date Jan 2, 2003
- International Business Machines Corporation
- Charles J. Montrose
- G01 - MEASURING TESTING
Information Patent Application
Stress testing for semiconductor devices
- Publication number 20020093357
- Publication date Jul 18, 2002
- International Business Machines Corporation
- Charles Montrose
- G01 - MEASURING TESTING

Charles J. Montrose

Person

Patents Grantslast 30 patents

Voltage-driven intelligent characterization bench for semiconductor

Memory tester design for soft error rate (SER) failure analysis

Voltage-driven intelligent characterization bench for semiconductor

Radiation hardened memory cell and design structures

Voltage driver for a voltage-driven intelligent characterization be...

Apparatus for accurate and efficient quality and reliability evalua...

Method and apparatus for testing a micro electromechanical device

Stress testing for semiconductor devices

Electromigration and extrusion monitor and control system

Circuit for bipolar transistor stress and qualification

Method and apparatus for characterization of gate dielectrics

Power booster and current measuring unit

System and method for diagnosing mechanical clocks

Patents Applicationslast 30 patents

MEMORY TESTER DESIGN FOR SOFT ERROR RATE (SER) FAILURE ANALYSIS

VOLTAGE-DRIVEN INTELLIGENT CHARACTERIZATION BENCH FOR SEMICONDUCTOR

RADIATION HARDENED MEMORY CELL AND DESIGN STRUCTURES

VOLTAGE-DRIVEN INTELLIGENT CHARACTERIZATION BENCH FOR SEMICONDUCTOR

METHOD FOR INFORMATION TRANSFER IN A VOLTAGE-DRIVEN INTELLIGENT CHA...

VOLTAGE DRIVER FOR A VOLTAGE-DRIVEN INTELLIGENT CHARACTERIZATION BE...

APPARATUS FOR ACCURATE AND EFFICIENT QUALITY AND RELIABILITY EVALUA...

METHOD AND APPARATUS FOR TESTING A MICRO ELECTROMECHANICAL DEVICE

Stress testing for semiconductor devices

Stress testing for semiconductor devices