Charles K. Harris

Person

Dallas, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for inspection using off-angle lighting
- Patent number 7,024,031
- Issue date Apr 4, 2006
- August Technology Corp.
- Ramiro Castellanos-Nolasco
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting bumped wafers
- Patent number 6,765,666
- Issue date Jul 20, 2004
- Semiconductor Technologies & Instruments, Inc.
- Clyde Maxwell Guest
- G01 - MEASURING TESTING
Information Patent Grant
Efficient illumination system for wire bonders
- Patent number 6,292,580
- Issue date Sep 18, 2001
- Texas Instruments Incorporated
- Sreenivasan K. Koduri
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System and method of optically inspecting surface structures on an...
- Patent number 6,292,260
- Issue date Sep 18, 2001
- ISOA, Inc.
- Youling Lin
- G01 - MEASURING TESTING
Information Patent Grant
System and method for selection of a reference die
- Patent number 6,252,981
- Issue date Jun 26, 2001
- Semiconductor Technologies & Instruments, Inc.
- Clyde Maxwell Guest
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High speed lead inspection system
- Patent number 6,128,034
- Issue date Oct 3, 2000
- Semiconductor Technologies & Instruments, Inc.
- Charles K. Harris
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Efficient hybrid illuminator
- Patent number 6,042,247
- Issue date Mar 28, 2000
- Texas Instruments Incorporated
- Sreenivasan K. Koduri
- G02 - OPTICS
Information Patent Grant
Apparatus and method for identifying defective objects
- Patent number 5,987,161
- Issue date Nov 16, 1999
- Texas Instruments Incorporated
- Dennis Lee Doane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system and method for leads of semiconductor devices
- Patent number 5,956,134
- Issue date Sep 21, 1999
- Semiconductor Technologies & Instruments, Inc.
- Rajiv Roy
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device lead inspection system
- Patent number 5,414,458
- Issue date May 9, 1995
- Texas Instruments Incorporated
- Charles K. Harris
- G02 - OPTICS
Information Patent Grant
Semiconductor device lead inspection system
- Patent number 5,402,505
- Issue date Mar 28, 1995
- Texas Instruments Incorporated
- Rajiv Roy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Container inspection system
- Patent number 5,220,400
- Issue date Jun 15, 1993
- Texas Instruments Incorporated
- Charles H. Anderson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System and method for bump height measurement
- Publication number 20040086198
- Publication date May 6, 2004
- Gerald Brown
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for selection of a reference die
- Publication number 20010028734
- Publication date Oct 11, 2001
- Clyde Maxwell Guest
- G06 - COMPUTING CALCULATING COUNTING

Charles K. Harris

Person

Patents Grantslast 30 patents

System and method for inspection using off-angle lighting

System and method for inspecting bumped wafers

Efficient illumination system for wire bonders

System and method of optically inspecting surface structures on an...

System and method for selection of a reference die

High speed lead inspection system

Efficient hybrid illuminator

Apparatus and method for identifying defective objects

Inspection system and method for leads of semiconductor devices

Semiconductor device lead inspection system

Semiconductor device lead inspection system

Container inspection system

Patents Applicationslast 30 patents

System and method for bump height measurement

System and method for selection of a reference die