Charles Marks

Follow

Person

Minneapolis, MN, US

People

Patents Grantslast 30 patents

Information Patent Grant
Wafer level integrated circuit probe array and method of construction
- Patent number 10,330,702
- Issue date Jun 25, 2019
- Johnstech International Corporation
- Jathan Edwards
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level integrated circuit probe array and method of construction
- Patent number 10,078,101
- Issue date Sep 18, 2018
- Johnstech International Corporation
- Jathan Edwards
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level integrated circuit contactor and method of construction
- Patent number 9,817,026
- Issue date Nov 14, 2017
- Johnstech International Corporation
- Jathan Edwards
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level integrated circuit contactor and method of construction
- Patent number 9,261,537
- Issue date Feb 16, 2016
- Johnstech International Corporation
- Jathan Edwards
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Wafer Level Integrated Circuit Probe Array and Method of Construction
- Publication number 20190041429
- Publication date Feb 7, 2019
- Johnstech International Corporation
- Jathan Edwards
- G01 - MEASURING TESTING
Information Patent Application
Wafer Level Integrated Circuit Probe Array and Method of Construction
- Publication number 20170074926
- Publication date Mar 16, 2017
- Johnstech International Corporation
- Jathan Edwards
- G01 - MEASURING TESTING
Information Patent Application
Wafer Level Integrated Circuit Contactor and Method of Construction
- Publication number 20160161528
- Publication date Jun 9, 2016
- Johnstech International Corporation
- Jathan Edwards
- G01 - MEASURING TESTING
Information Patent Application
Wafer Level Integrated Circuit Contactor and Method of Construction
- Publication number 20130342233
- Publication date Dec 26, 2013
- Jathan Edwards
- G01 - MEASURING TESTING