Charles Meyer

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Goleta, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope with improved feature location capabilities
- Patent number 9,081,028
- Issue date Jul 14, 2015
- Bruker Nano, Inc.
- Charles Meyer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cleaning station for atomic force microscope
- Patent number 8,782,811
- Issue date Jul 15, 2014
- Bruker Nano, Inc.
- Johannes H. Kindt
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCANNING PROBE MICROSCOPE WITH IMPROVED FEATURE LOCATION CAPABILITIES
- Publication number 20150082498
- Publication date Mar 19, 2015
- Bruker Nano, Inc.
- Charles Meyer
- G01 - MEASURING TESTING
Information Patent Application
Cleaning Station for Atomic Force Microscope
- Publication number 20120297510
- Publication date Nov 22, 2012
- BRUKER NANO INC
- Johannes H. Kindt
- G01 - MEASURING TESTING