Charles R. Meyer

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Santa Barbara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Cost effective, mass producible temperature controlled thermal imag...
- Patent number 12,055,446
- Issue date Aug 6, 2024
- SEEK THERMAL, INC.
- William J. Parrish
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for rapid automatic engagement of a probe
- Patent number 7,665,349
- Issue date Feb 23, 2010
- Veeco Instruments Inc.
- Paul I. Mininni
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for reducing lateral interactive forces during...
- Patent number 7,607,342
- Issue date Oct 27, 2009
- Vecco Instruments, Inc.
- Lin Huang
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope having automatic probe exchange and align...
- Patent number 5,705,814
- Issue date Jan 6, 1998
- Digital Instruments, Inc.
- James M. Young
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Stiffness enhancer for movable stage assembly
- Patent number 5,314,254
- Issue date May 24, 1994
- Digital Instruments
- Frank D. Yashar
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
COST EFFECTIVE, MASS PRODUCIBLE TEMPERATURE CONTROLLED THERMAL IMAG...
- Publication number 20240361191
- Publication date Oct 31, 2024
- Seek Thermal, Inc.
- William J. Parrish
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
COST EFFECTIVE, MASS PRODUCIBLE TEMPERATURE CONTROLLED THERMAL IMAG...
- Publication number 20210293632
- Publication date Sep 23, 2021
- Seek Thermal, Inc.
- William J. Parrish
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Reducing Lateral Interactive Forces During...
- Publication number 20070251305
- Publication date Nov 1, 2007
- Veeco Instruments lnc.
- Lin Huang
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for rapid automatic engagement of a prove
- Publication number 20060230474
- Publication date Oct 12, 2006
- Paul I. Mininni
- G01 - MEASURING TESTING
Information Patent Application
Cantilever array sensor system
- Publication number 20050121615
- Publication date Jun 9, 2005
- Craig Prater
- G02 - OPTICS
Information Patent Application
Cantilever array sensor system
- Publication number 20020092340
- Publication date Jul 18, 2002
- Veeco Instruments Inc.
- Craig Prater
- G01 - MEASURING TESTING