Charles Silver

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Richmond, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Layered scanning charged particle microscope package for a charged...
- Patent number 8,110,801
- Issue date Feb 7, 2012
- Agilent Technologies, Inc.
- Scott W. Indermuehle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated deflectors for beam alignment and blanking in charged pa...
- Patent number 8,003,952
- Issue date Aug 23, 2011
- Agilent Technologies, Inc.
- Lawrence P. Muray
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
LAYERED SCANNING CHARGED PARTICLE MICROSCOPE PACKAGE FOR A CHARGED...
- Publication number 20100224779
- Publication date Sep 9, 2010
- Scott W. Indermuehle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED DEFLECTORS FOR BEAM ALIGNMENT AND BLANKING IN CHARGED PA...
- Publication number 20080217531
- Publication date Sep 11, 2008
- Lawrence P. Muray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD OF DETECTING SECONDARY ELECTRONS
- Publication number 20080054180
- Publication date Mar 6, 2008
- Charles Silver
- H01 - BASIC ELECTRIC ELEMENTS