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Charles Thomas Larson
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Belmont, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
XPS metrology for process control in selective deposition
Patent number
11,346,795
Issue date
May 31, 2022
NOVA MEASURING INSTRUMENTS, INC.
Charles Thomas Larson
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Feed-forward of multi-layer and multi-process information using XPS...
Patent number
11,029,148
Issue date
Jun 8, 2021
NOVA MEASURING INSTRUMENTS, INC.
Heath A. Pois
G01 - MEASURING TESTING
Information
Patent Grant
XPS metrology for process control in selective deposition
Patent number
10,801,978
Issue date
Oct 13, 2020
NOVA MEASURING INSTRUMENTS, INC.
Charles Thomas Larson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Feed-forward of multi-layer and multi-process information using XPS...
Patent number
10,648,802
Issue date
May 12, 2020
NOVA MEASURING INSTRUMENTS, INC.
Heath A. Pois
G01 - MEASURING TESTING
Information
Patent Grant
Feed-forward of multi-layer and multi-process information using XPS...
Patent number
10,082,390
Issue date
Sep 25, 2018
Nova Measuring Instruments Inc.
Heath A. Pois
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
XPS METROLOGY FOR PROCESS CONTROL IN SELECTIVE DEPOSITION
Publication number
20210025839
Publication date
Jan 28, 2021
Nova Measuring Instruments, Inc.
Charles Thomas Larson
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...
Publication number
20200370885
Publication date
Nov 26, 2020
Nova Measuring Instruments, Inc.
Heath A. Pois
G01 - MEASURING TESTING
Information
Patent Application
FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...
Publication number
20190360800
Publication date
Nov 28, 2019
Nova Measuring Instruments, Inc.
Heath A. Pois
G01 - MEASURING TESTING
Information
Patent Application
XPS METROLOGY FOR PROCESS CONTROL IN SELECTIVE DEPOSITION
Publication number
20190277783
Publication date
Sep 12, 2019
Nova Measuring Instruments, Inc.
Charles Thomas Larson
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...
Publication number
20190033069
Publication date
Jan 31, 2019
Nova Measuring Instruments, Inc.
Heath A. Pois
G01 - MEASURING TESTING
Information
Patent Application
Feed-Forward of Multi-Layer and Multi-Process Information using XPS...
Publication number
20170160081
Publication date
Jun 8, 2017
ReVera, Incorporated
Heath A. Pois
G01 - MEASURING TESTING