Charles W. Schietinger

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Optical techniques for measuring layer thicknesses and other surfac...
- Patent number 7,042,581
- Issue date May 9, 2006
- Luxtron Corporation
- Charles W. Schietinger
- B24 - GRINDING POLISHING
Information Patent Grant
Optical techniques for measuring layer thicknesses and other surfac...
- Patent number 6,934,040
- Issue date Aug 23, 2005
- Luxtron Corporation
- Charles W. Schietinger
- B24 - GRINDING POLISHING
Information Patent Grant
Optical techniques for measuring layer thicknesses and other surfac...
- Patent number 6,654,132
- Issue date Nov 25, 2003
- Luxtron Corporation
- Charles W. Schietinger
- B24 - GRINDING POLISHING
Information Patent Grant
Optical techniques for measuring layer thicknesses and other surfac...
- Patent number 6,570,662
- Issue date May 27, 2003
- Luxtron Corporation
- Charles W. Schietinger
- B24 - GRINDING POLISHING
Information Patent Grant
Non-contact optical techniques for measuring surface conditions
- Patent number 5,769,540
- Issue date Jun 23, 1998
- Luxtron Corporation
- Charles W. Schietinger
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact optical techniques for measuring surface conditions
- Patent number 5,490,728
- Issue date Feb 13, 1996
- Luxtron Corporation
- Charles W. Schietinger
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact techniques for measuring temperature of radiation-heate...
- Patent number 5,318,362
- Issue date Jun 7, 1994
- Luxtron Corporation
- Charles W. Schietinger
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact optical techniques for measuring surface conditions
- Patent number 5,310,260
- Issue date May 10, 1994
- Luxtron Corporation
- Charles W. Schietinger
- G01 - MEASURING TESTING
Information Patent Grant
Techniques for measuring the thickness of a film formed on a substrate
- Patent number 5,166,080
- Issue date Nov 24, 1992
- Luxtron Corporation
- Charles W. Schietinger
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact techniques for measuring temperature or radiation-heate...
- Patent number 5,154,512
- Issue date Oct 13, 1992
- Luxtron Corporation
- Charles W. Schietinger
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
In-situ wafer parameter measurement method employing a hot suscepto...
- Publication number 20060190211
- Publication date Aug 24, 2006
- Charles W. Schietinger
- G01 - MEASURING TESTING
Information Patent Application
Optical techniques for measuring layer thicknesses and other surfac...
- Publication number 20050105103
- Publication date May 19, 2005
- Luxtron Corporation
- Charles W. Schietinger
- B24 - GRINDING POLISHING

Charles W. Schietinger

Person

Patents Grantslast 30 patents

Optical techniques for measuring layer thicknesses and other surfac...

Optical techniques for measuring layer thicknesses and other surfac...

Optical techniques for measuring layer thicknesses and other surfac...

Optical techniques for measuring layer thicknesses and other surfac...

Non-contact optical techniques for measuring surface conditions

Non-contact optical techniques for measuring surface conditions

Non-contact techniques for measuring temperature of radiation-heate...

Non-contact optical techniques for measuring surface conditions

Techniques for measuring the thickness of a film formed on a substrate

Non-contact techniques for measuring temperature or radiation-heate...

Patents Applicationslast 30 patents

In-situ wafer parameter measurement method employing a hot suscepto...

Optical techniques for measuring layer thicknesses and other surfac...