Charles Xiaoyi Wang

Follow

Person

Santa Clara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Oblique illuminator for inspecting manufactured substrates
- Patent number 9,423,357
- Issue date Aug 23, 2016
- KLA-Tencor Corporation
- Shiyu Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Oblique illuminator for inspecting manufactured substrates
- Patent number 8,794,801
- Issue date Aug 5, 2014
- KLA-Tencor Corporation
- Shiyu Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Polarized broadband wafer inspection
- Patent number 7,710,564
- Issue date May 4, 2010
- KLA-Tencor Corporation
- Peter Hill
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for providing illumination of a specimen for a...
- Patent number 7,705,331
- Issue date Apr 27, 2010
- KLA-Tencor Technologies Corp.
- Greg Kirk
- G01 - MEASURING TESTING
Information Patent Grant
System and method for illuminating a specimen with uniform angular...
- Patent number 7,654,715
- Issue date Feb 2, 2010
- KLA-Tencor Technologies Corporation
- Qibiao Chen
- G01 - MEASURING TESTING
Information Patent Grant
Q-switching method for pulse train generation
- Patent number 6,683,893
- Issue date Jan 27, 2004
- Coherent, Inc.
- Charles X. Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser rod thermalization
- Patent number 6,414,980
- Issue date Jul 2, 2002
- Coherent, Inc.
- Charles Xiaoyi Wang
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
OBLIQUE ILLUMINATOR FOR INSPECTING MANUFACTURED SUBSTRATES
- Publication number 20140299779
- Publication date Oct 9, 2014
- KLA-Tencor Corporation
- Shiyu ZHANG
- G01 - MEASURING TESTING
Information Patent Application
OBLIQUE ILLUMINATOR FOR INSPECTING MANUFACTURED SUBSTRATES
- Publication number 20120218545
- Publication date Aug 30, 2012
- KLA-Tencor Corporation
- Shiyu Zhang
- G01 - MEASURING TESTING