Charley Chunlei Gao

Person

San Diego, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated passive device substrates
- Patent number 7,936,043
- Issue date May 3, 2011
- Sychip Inc.
- Yinon Degani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Shielding noisy conductors in integrated passive devices
- Patent number 7,795,709
- Issue date Sep 14, 2010
- Sychip Inc.
- Yinon Degani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact balun transformers
- Patent number 7,692,511
- Issue date Apr 6, 2010
- Sychip Inc.
- Yinon Degani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated passive devices
- Patent number 7,382,056
- Issue date Jun 3, 2008
- Sychip Inc.
- Anthony M. Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated passive devices with high Q inductors
- Patent number 7,355,264
- Issue date Apr 8, 2008
- Sychip Inc.
- Yinon Degani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing integrated circuits
- Patent number 7,061,258
- Issue date Jun 13, 2006
- Sychip Inc.
- Yinon Degani
- G01 - MEASURING TESTING
Information Patent Grant
Membrane test method and apparatus for integrated circuit testing
- Patent number 6,867,607
- Issue date Mar 15, 2005
- Sychip, Inc.
- Yinon Degani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Compact balun transformers
- Publication number 20090237175
- Publication date Sep 24, 2009
- Yinon Degani
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MCM packages
- Publication number 20090184416
- Publication date Jul 23, 2009
- Yinon Degani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Shielding noisy conductors in integrated passive devices
- Publication number 20080061405
- Publication date Mar 13, 2008
- Yinon Degani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED PASSIVE DEVICES WITH HIGH Q INDUCTORS
- Publication number 20080061420
- Publication date Mar 13, 2008
- Yinon Degani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated passive device substrates
- Publication number 20070215976
- Publication date Sep 20, 2007
- Yinon Degani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Shielding noisy conductors in integrated passive devices
- Publication number 20060255434
- Publication date Nov 16, 2006
- Yinon Degani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Cellular/Wi-Fi combination devices
- Publication number 20060217102
- Publication date Sep 28, 2006
- Yinon Degani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High frequency integrated circuits
- Publication number 20060197182
- Publication date Sep 7, 2006
- Yinon Degani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated passive devices
- Publication number 20050253257
- Publication date Nov 17, 2005
- Anthony M. Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Testing integrated circuits
- Publication number 20050088194
- Publication date Apr 28, 2005
- Yinon Degani
- G01 - MEASURING TESTING
Information Patent Application
High frequency integrated circuits
- Publication number 20040075170
- Publication date Apr 22, 2004
- Yinon Degani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Testing integrated circuits
- Publication number 20030137315
- Publication date Jul 24, 2003
- Yinon Degani
- G01 - MEASURING TESTING

Charley Chunlei Gao

Person

Patents Grantslast 30 patents

Integrated passive device substrates

Shielding noisy conductors in integrated passive devices

Compact balun transformers

Integrated passive devices

Integrated passive devices with high Q inductors

Testing integrated circuits

Membrane test method and apparatus for integrated circuit testing

Patents Applicationslast 30 patents

Compact balun transformers

MCM packages

Shielding noisy conductors in integrated passive devices

INTEGRATED PASSIVE DEVICES WITH HIGH Q INDUCTORS

Integrated passive device substrates

Shielding noisy conductors in integrated passive devices

Cellular/Wi-Fi combination devices

High frequency integrated circuits

Integrated passive devices

Testing integrated circuits

High frequency integrated circuits

Testing integrated circuits