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Charly D. Allemand
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Nantucket, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Particle detection method and apparatus
Patent number
5,317,380
Issue date
May 31, 1994
Inspex, Inc.
Charly D. Allemand
G01 - MEASURING TESTING
Information
Patent Grant
Emissivity independent multiwavelength pyrometer
Patent number
5,132,922
Issue date
Jul 21, 1992
Massachusetts Institute of Technology
Mansoor A. Khan
G01 - MEASURING TESTING
Information
Patent Grant
Particle detection method and apparatus
Patent number
4,895,446
Issue date
Jan 23, 1990
Inspex Incorporated
Mario A. Maldari
G01 - MEASURING TESTING
Information
Patent Grant
Particle detection method and apparatus
Patent number
4,772,126
Issue date
Sep 20, 1988
Inspex Incorporated
Charly D. Allemand
G01 - MEASURING TESTING
Information
Patent Grant
Particle detection method and apparatus
Patent number
4,655,592
Issue date
Apr 7, 1987
Hamamatsu Systems, Inc.
Charly D. Allemand
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometer
Patent number
4,591,267
Issue date
May 27, 1986
Baird Corporation
Donald R. Demers
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometer
Patent number
4,575,241
Issue date
Mar 11, 1986
Baird Corporation
Donald R. Demers
G01 - MEASURING TESTING
Information
Patent Grant
Monochromatic imaging apparatus
Patent number
4,455,087
Issue date
Jun 19, 1984
Hamamatsu Systems Inc.
Charly D. Allemand
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometer
Patent number
4,432,644
Issue date
Feb 21, 1984
Baird Corporation
Donald R. Demers
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for detecting particles on a material
Patent number
4,377,340
Issue date
Mar 22, 1983
Hamamatsu Systems, Inc.
Gary P. Green
G01 - MEASURING TESTING