Che-Huai Hung

Person

Hsinchu County, TW

People

Patents Grantslast 30 patents

Information Patent Grant
In-line inspection yield prediction system
- Patent number 8,594,963
- Issue date Nov 26, 2013
- Macronix International Co., Ltd.
- Hsiang-Chou Liao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test pattern for detecting piping in a memory array
- Patent number 8,329,480
- Issue date Dec 11, 2012
- Macronix International Co., Ltd.
- Che-Lun Hung
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
DIE STRUCTURE, CONTACT TEST STRUCTURE, AND CONTACT TESTING METHOD U...
- Publication number 20160041201
- Publication date Feb 11, 2016
- Macronix International Co., Ltd.
- Che-Lun Hung
- G01 - MEASURING TESTING
Information Patent Application
METHOD, SYSTEMS, AND DEVICES FOR INSPECTING SEMICONDUCTOR DEVICES
- Publication number 20150293169
- Publication date Oct 15, 2015
- Macronix International Co., Ltd.
- Yen Chuang
- G01 - MEASURING TESTING
Information Patent Application
TEST PATTERN DESIGN FOR SEMICONDUCTOR DEVICES AND METHOD OF UTILIZI...
- Publication number 20140253137
- Publication date Sep 11, 2014
- MACRONIX INTERNATIONAL CO., LTD.
- Yen Chuang
- G01 - MEASURING TESTING
Information Patent Application
TEST PATTERN FOR DETECTING PIPING IN A MEMORY ARRAY
- Publication number 20120074401
- Publication date Mar 29, 2012
- MACRONIX INTERNATIONAL CO., LTD
- Che-Lun Hung
- G11 - INFORMATION STORAGE
Information Patent Application
IN-LINE INSPECTION YIELD PREDICTION SYSTEM
- Publication number 20120053855
- Publication date Mar 1, 2012
- MACRONIX INTERNATIONAL CO., LTD
- Hsiang-Chou Liao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE AND MANUFACTURING METHOD THEREOF, AND SEMICONDUCTOR D...
- Publication number 20100052036
- Publication date Mar 4, 2010
- POWERCHIP SEMICONDUCTOR CORP.
- Cheng-Hong Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FABRICATING NON-VOLATILE MEMORY
- Publication number 20070048937
- Publication date Mar 1, 2007
- Chin-Chung Wang
- H01 - BASIC ELECTRIC ELEMENTS

Che-Huai Hung

Person

Patents Grantslast 30 patents

In-line inspection yield prediction system

Test pattern for detecting piping in a memory array

Patents Applicationslast 30 patents

DIE STRUCTURE, CONTACT TEST STRUCTURE, AND CONTACT TESTING METHOD U...

METHOD, SYSTEMS, AND DEVICES FOR INSPECTING SEMICONDUCTOR DEVICES

TEST PATTERN DESIGN FOR SEMICONDUCTOR DEVICES AND METHOD OF UTILIZI...

TEST PATTERN FOR DETECTING PIPING IN A MEMORY ARRAY

IN-LINE INSPECTION YIELD PREDICTION SYSTEM

MEMORY DEVICE AND MANUFACTURING METHOD THEREOF, AND SEMICONDUCTOR D...

METHOD OF FABRICATING NON-VOLATILE MEMORY