Che-Wei Chou

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Yunlin County, TW

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Patents Grantslast 30 patents

Information Patent Grant
Delay measurement circuit and measuring method thereof
- Patent number 10,209,298
- Issue date Feb 19, 2019
- National Central University
- Jin-Fu Li
- G01 - MEASURING TESTING
Information Patent Grant
3-D memory and built-in self-test circuit thereof
- Patent number 9,406,401
- Issue date Aug 2, 2016
- Industrial Technology Research Institute
- Chih-Yen Lo
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
DELAY MEASUREMENT CIRCUIT AND MEASURING METHOD THEREOF
- Publication number 20170343602
- Publication date Nov 30, 2017
- National Central University
- Jin-Fu Li
- G01 - MEASURING TESTING
Information Patent Application
3-D Memory and Built-In Self-Test Circuit Thereof
- Publication number 20130326294
- Publication date Dec 5, 2013
- Industrial Technology Research Institute
- Chih-Yen Lo
- G11 - INFORMATION STORAGE