Che-Yuan Sun

Person

Hualien County, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Forecasting wafer defects using frequency domain analysis
- Patent number 10,867,116
- Issue date Dec 15, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yang-Hung Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Forecasting wafer defects using frequency domain analysis
- Patent number 10,521,548
- Issue date Dec 31, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yang-Hung Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of extracting defects
- Patent number 10,163,733
- Issue date Dec 25, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jia-Rui Hu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Forecasting wafer defects using frequency domain analysis
- Patent number 10,031,997
- Issue date Jul 24, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yang-Hung Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Driving interface device adaptive to a flat speaker
- Patent number 8,588,438
- Issue date Nov 19, 2013
- Industrial Technology Research Institute
- Kuo-Hua Tseng
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
Forecasting Wafer Defects Using Frequency Domain Analysis
- Publication number 20200125785
- Publication date Apr 23, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Yang-Hung Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FORECASTING WAFER DEFECTS USING FREQUENCY DOMAIN ANALYSIS
- Publication number 20180330040
- Publication date Nov 15, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yang-Hung Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FORECASTING WAFER DEFECTS USING FREQUENCY DOMAIN ANALYSIS
- Publication number 20180196911
- Publication date Jul 12, 2018
- TAIWAN SEMICONDUTOR MANUFACTURING CO., LTD.
- Yang-Hung Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF EXTRACTING DEFECTS
- Publication number 20170345725
- Publication date Nov 30, 2017
- Taiwan Semiconductor Manufacturing Co., LTD
- Jia-Rui HU
- G01 - MEASURING TESTING
Information Patent Application
DRIVING INTERFACE DEVICE ADAPTIVE TO A FLAT SPEAKER
- Publication number 20120106761
- Publication date May 3, 2012
- Industrial Technology Research Institute
- Kuo-Hua Tseng
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
FLAT SPEAKER STRUCTURE AND MANUFACTURING METHOD THEREOF
- Publication number 20120051564
- Publication date Mar 1, 2012
- Industrial Technology Research Institute
- Chang-Ho Liou
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Che-Yuan Sun

Person

Patents Grantslast 30 patents

Forecasting wafer defects using frequency domain analysis

Forecasting wafer defects using frequency domain analysis

Method of extracting defects

Forecasting wafer defects using frequency domain analysis

Driving interface device adaptive to a flat speaker

Patents Applicationslast 30 patents

Forecasting Wafer Defects Using Frequency Domain Analysis

FORECASTING WAFER DEFECTS USING FREQUENCY DOMAIN ANALYSIS

FORECASTING WAFER DEFECTS USING FREQUENCY DOMAIN ANALYSIS

METHOD OF EXTRACTING DEFECTS

DRIVING INTERFACE DEVICE ADAPTIVE TO A FLAT SPEAKER

FLAT SPEAKER STRUCTURE AND MANUFACTURING METHOD THEREOF