Chea-Ok KO

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Yongin-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Device for measuring integrated circuit current and method of measu...
- Patent number 10,401,397
- Issue date Sep 3, 2019
- Samsung Electronics Co., Ltd.
- Sang-Ho Lim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE FOR MEASURING INTEGRATED CIRCUIT CURRENT AND METHOD OF MEASU...
- Publication number 20140222360
- Publication date Aug 7, 2014
- Samsung Electronics Co., Ltd.
- Sang-Ho LIM
- G01 - MEASURING TESTING