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Ayer Keroh, MY
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Patents Grants
last 30 patents
Information
Patent Grant
Testing integrated circuit packaging for shorts
Patent number
9,207,278
Issue date
Dec 8, 2015
Texas Instruments Incorporated
Hoon Siong Chia
G01 - MEASURING TESTING
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Patent Grant
Testing integrated circuit packaging for output short circuit current
Patent number
9,140,751
Issue date
Sep 22, 2015
Texas Instruments Incorporated
Chee Peng Ong
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Testing Integrated Circuit Packaging for Output Short Circuit Current
Publication number
20140292361
Publication date
Oct 2, 2014
TEXAS INSTRUMENTS INCORPORATED
Chee Peng Ong
G01 - MEASURING TESTING
Information
Patent Application
Testing Integrated Circuit Packaging for Shorts
Publication number
20140285229
Publication date
Sep 25, 2014
TEXAS INSTRUMENTS INCORPORATED
Hoon Siong Chia
G01 - MEASURING TESTING