Chen Dror

Follow

Person

Tivon, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Substrate with cut semiconductor pieces having measurement test str...
- Patent number 11,978,679
- Issue date May 7, 2024
- KLA Corporation
- Chen Dror
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for error reduction for metrology measurements
- Patent number 11,353,799
- Issue date Jun 7, 2022
- Roie Volkovich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metrology target identification, design and verification
- Patent number 10,387,608
- Issue date Aug 20, 2019
- KLA-Tencor Corporation
- Michael Adel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology target identification, design and verification
- Patent number 9,910,953
- Issue date Mar 6, 2018
- KLA-Tencor Corporation
- Michael Adel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
System and Method for Error Reduction for Metrology Measurements
- Publication number 20220155693
- Publication date May 19, 2022
- KLA Corporation
- Roie Volkovich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Substrate with Cut Semiconductor Pieces Having Measurement Test Str...
- Publication number 20210351089
- Publication date Nov 11, 2021
- KLA Corporation
- Chen Dror
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METROLOGY TARGET IDENTIFICATION, DESIGN AND VERIFICATION
- Publication number 20180032662
- Publication date Feb 1, 2018
- KLA-Tencor Corporation
- Michael Adel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METROLOGY TARGET INDENTIFICATION, DESIGN AND VERIFICATION
- Publication number 20160196379
- Publication date Jul 7, 2016
- Michael Adel
- G06 - COMPUTING CALCULATING COUNTING