Chen Gao

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Hefei, CN

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Patents Grantslast 30 patents

Information Patent Grant
Analytical scanning evanescent microwave microscope and control stage
- Patent number 8,358,141
- Issue date Jan 22, 2013
- The Regents of the University of California
- Xiao-Dong Xiang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Analytical scanning evanescent microwave microscope and control stage
- Patent number 7,550,963
- Issue date Jun 23, 2009
- The Regents of the University of California
- Xiao-Dong Xiang
- G01 - MEASURING TESTING
Information Patent Grant
Scanning evanescent electro-magnetic microscope
- Patent number 6,532,806
- Issue date Mar 18, 2003
- The Regents of the University of California
- Xiao-Dong Xiang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ANALYTICAL SCANNING EVANESCENT MICROWAVE MICROSCOPE AND CONTROL STAGE
- Publication number 20090302866
- Publication date Dec 10, 2009
- The Regents of the University of California
- Xiao-Dong Xiang
- G01 - MEASURING TESTING
Information Patent Application
Analytical scanning evanescent microwave microscope and control stage
- Publication number 20060231756
- Publication date Oct 19, 2006
- Intematix Corporation
- Xiao-Dong Xiang
- G01 - MEASURING TESTING