CHEN-KANG CHIU

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ZHUBEI, TW

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Patents Grantslast 30 patents

Information Patent Grant
Probe module
- Patent number 9,470,716
- Issue date Oct 18, 2016
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD
- Publication number 20180335449
- Publication date Nov 22, 2018
- MPI Corporation
- Keng-Sheng CHANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE MODULE
- Publication number 20150185253
- Publication date Jul 2, 2015
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION PLATE
- Publication number 20150168531
- Publication date Jun 18, 2015
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING