CHENG-CHEN CALVIN HSUEH

Person

TAIPEI, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for controlling silicon nitride etching tank
- Patent number 8,834,671
- Issue date Sep 16, 2014
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Zin-Chang Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for controlling silicon nitride etching tank
- Patent number 8,409,997
- Issue date Apr 2, 2013
- Taiwan Semiconductor Maufacturing Co., LTD
- Zin-Chang Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isolation structures and methods of fabricating isolation structures
- Patent number 8,012,846
- Issue date Sep 6, 2011
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Cheng-Yuan Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuits with stress memory effect and fabrication metho...
- Patent number 7,795,644
- Issue date Sep 14, 2010
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Mei-Yun Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating read only memory including a first and secon...
- Patent number 6,998,316
- Issue date Feb 14, 2006
- Macronix International Co, Ltd.
- Tahorng Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating read only memory including forming masking l...
- Patent number 6,734,064
- Issue date May 11, 2004
- Macronix International Co., Ltd.
- Tahorng Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating mask read only memory
- Patent number 6,670,247
- Issue date Dec 30, 2003
- Macronix International Co., Ltd.
- Cheng-Chen Calvin Hsueh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming damascene structure
- Patent number 6,468,897
- Issue date Oct 22, 2002
- Macronix International Co., Ltd.
- Chi-Feng Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing flash memory
- Patent number 6,448,136
- Issue date Sep 10, 2002
- Macronix International Co., Ltd.
- Kent Kuohua Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to improve nitride floating gate charge trapping for NROM fl...
- Patent number 6,444,521
- Issue date Sep 3, 2002
- Macronix International Co., Ltd.
- Kent Kuo-Hua Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming air gaps for reducing interconnect capacitance
- Patent number 6,136,687
- Issue date Oct 24, 2000
- Integrated Device Technology, Inc.
- Shih-Ked Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isolation trenches with protected corners
- Patent number 5,981,356
- Issue date Nov 9, 1999
- Integrated Device Technology, Inc.
- Cheng-Chen Calvin Hsueh
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR CONTROLLING SILICON NITRIDE ETCHING TANK
- Publication number 20130217235
- Publication date Aug 22, 2013
- TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Zin-Chang Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR CONTROLLING SILICON NITRIDE ETCHING TANK
- Publication number 20080179293
- Publication date Jul 31, 2008
- Taiwan Semiconductor Manufacturing Co., LTD
- Zin-Chang Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated circuits with stress memory effect and fabrication metho...
- Publication number 20080164530
- Publication date Jul 10, 2008
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Mei-Yun Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ISOLATION STRUCTURES AND METHODS OF FABRICATING ISOLATION STRUCTURES
- Publication number 20080032482
- Publication date Feb 7, 2008
- Taiwan Semiconductor Manufacturing Co., LTD
- Cheng-Yuan Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
[METHOD FOR FABRICATING READ ONLY MEMORY]
- Publication number 20040161900
- Publication date Aug 19, 2004
- TAHORNG YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for fabricating read only memory
- Publication number 20030181013
- Publication date Sep 25, 2003
- TAHORNG YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of fabricating mask read only memory
- Publication number 20020177278
- Publication date Nov 28, 2002
- Cheng-Chen Calvin Hsueh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of manufacturing flash memory
- Publication number 20020072175
- Publication date Jun 13, 2002
- Kent Kuohua Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for manufacturing self-aligned silicide layer
- Publication number 20020034867
- Publication date Mar 21, 2002
- Chi-Tung Huang
- H01 - BASIC ELECTRIC ELEMENTS

CHENG-CHEN CALVIN HSUEH

Person

Patents Grantslast 30 patents

Apparatus and method for controlling silicon nitride etching tank

Apparatus and method for controlling silicon nitride etching tank

Isolation structures and methods of fabricating isolation structures

Integrated circuits with stress memory effect and fabrication metho...

Method for fabricating read only memory including a first and secon...

Method for fabricating read only memory including forming masking l...

Method of fabricating mask read only memory

Method of forming damascene structure

Method of manufacturing flash memory

Method to improve nitride floating gate charge trapping for NROM fl...

Method of forming air gaps for reducing interconnect capacitance

Isolation trenches with protected corners

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR CONTROLLING SILICON NITRIDE ETCHING TANK

APPARATUS AND METHOD FOR CONTROLLING SILICON NITRIDE ETCHING TANK

Integrated circuits with stress memory effect and fabrication metho...

ISOLATION STRUCTURES AND METHODS OF FABRICATING ISOLATION STRUCTURES

[METHOD FOR FABRICATING READ ONLY MEMORY]

Method for fabricating read only memory

Method of fabricating mask read only memory

Method of manufacturing flash memory

Method for manufacturing self-aligned silicide layer