Cheng-Jer YANG

Person

Hefei, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor structure
- Patent number 12,341,132
- Issue date Jun 24, 2025
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Cheng-Jer Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory structure including elastic material based buffer column str...
- Patent number 12,293,979
- Issue date May 6, 2025
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Cheng-Jer Yang
- G11 - INFORMATION STORAGE
Information Patent Grant
Readout circuit layout structure, readout circuit, and memory layou...
- Patent number 12,033,691
- Issue date Jul 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Cheng-Jer Yang
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing method, testing system, and testing apparatus for semicondu...
- Patent number 11,929,132
- Issue date Mar 12, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Cheng-Jer Yang
- G11 - INFORMATION STORAGE
Information Patent Grant
Through-silicon via (TSV) fault-tolerant circuit, method for TSV fa...
- Patent number 11,892,502
- Issue date Feb 6, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Cheng-Jer Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit for testing a memory and test method thereof
- Patent number 11,886,733
- Issue date Jan 30, 2024
- Changxin Memory Technologies, Inc.
- Cheng-Jer Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for manufacturing semiconductor layer
- Patent number 11,876,001
- Issue date Jan 16, 2024
- NEXCHIP SEMICONDUCTOR CORPORATION
- Baoyou Gong
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Word line driving circuit and dynamic random access memory
- Patent number 11,869,576
- Issue date Jan 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Cheng-Jer Yang
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing method for packaged chip, testing system for packaged chip,...
- Patent number 11,862,269
- Issue date Jan 2, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Cheng-Jer Yang
- G11 - INFORMATION STORAGE
Information Patent Grant
Word line drive circuit and dynamic random access memory
- Patent number 11,830,553
- Issue date Nov 28, 2023
- Changxin Memory Technologies, Inc.
- Cheng-Jer Yang
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory test circuit apparatus and test method
- Patent number 11,715,543
- Issue date Aug 1, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Cheng-Jer Yang
- G11 - INFORMATION STORAGE
Information Patent Grant
Through-silicon via detecting circuit, detecting methods and integr...
- Patent number 11,614,481
- Issue date Mar 28, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- You-Hsien Lin
- G01 - MEASURING TESTING
Information Patent Grant
Boundary test circuit, memory and boundary test method
- Patent number 11,340,294
- Issue date May 24, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Cheng-Jer Yang
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor Structure and Method of Making the Same
- Publication number 20240170329
- Publication date May 23, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC
- CHENG-JER YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE
- Publication number 20230282617
- Publication date Sep 7, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- CHENG-JER YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING METHOD FOR PACKAGED CHIP, TESTING SYSTEM FOR PACKAGED CHIP,...
- Publication number 20230187005
- Publication date Jun 15, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Cheng-Jer YANG
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY STRUCTURE
- Publication number 20230015241
- Publication date Jan 19, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Cheng-Jer YANG
- G11 - INFORMATION STORAGE
Information Patent Application
TESTING METHOD, TESTING SYSTEM, AND TESTING APPARATUS FOR SEMICONDU...
- Publication number 20220399068
- Publication date Dec 15, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Cheng-Jer YANG
- G11 - INFORMATION STORAGE
Information Patent Application
READOUT CIRCUIT LAYOUT STRUCTURE, READOUT CIRCUIT, AND MEMORY LAYOU...
- Publication number 20220383940
- Publication date Dec 1, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Cheng-Jer YANG
- G11 - INFORMATION STORAGE
Information Patent Application
WORD LINE DRIVING CIRCUIT AND DYNAMIC RANDOM ACCESS MEMORY
- Publication number 20220310152
- Publication date Sep 29, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Cheng-Jer YANG
- G11 - INFORMATION STORAGE
Information Patent Application
WORD LINE DRIVE CIRCUIT AND DYNAMIC RANDOM ACCESS MEMORY
- Publication number 20220130460
- Publication date Apr 28, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Cheng-Jer YANG
- G11 - INFORMATION STORAGE
Information Patent Application
CIRCUIT FOR TESTING A MEMORY AND TEST METHOD THEREOF
- Publication number 20220100410
- Publication date Mar 31, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Cheng-Jer YANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR MANUFACTURING SEMICONDUCTOR LAYER
- Publication number 20220076966
- Publication date Mar 10, 2022
- Nexchip Semiconductor Corporation
- BAOYOU GONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR JUDGING ABNORMALITY OF PROBE CARD
- Publication number 20220034939
- Publication date Feb 3, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Cheng-Jer YANG
- G01 - MEASURING TESTING
Information Patent Application
THROUGH-SILICON VIA DETECTING CIRCUIT, DETECTING METHODS AND INTEGR...
- Publication number 20210239751
- Publication date Aug 5, 2021
- Changxin Memory Technologies, Inc.
- You-Hsien LIN
- G01 - MEASURING TESTING
Information Patent Application
THROUGH-SILICON VIA (TSV) FAULT-TOLERANT CIRCUIT, METHOD FOR TSV FA...
- Publication number 20210156908
- Publication date May 27, 2021
- Changxin Memory Technologies, Inc.
- Cheng-Jer YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BOUNDARY TEST CIRCUIT, MEMORY AND BOUNDARY TEST METHOD
- Publication number 20210156913
- Publication date May 27, 2021
- Changxin Memory Technologies, Inc.
- Cheng-Jer YANG
- G01 - MEASURING TESTING
Information Patent Application
MEMORY TEST CIRCUIT APPARATUS AND TEST METHOD
- Publication number 20210104289
- Publication date Apr 8, 2021
- Changxin Memory Technologies, Inc.
- Cheng-Jer YANG
- H03 - BASIC ELECTRONIC CIRCUITRY

Cheng-Jer YANG

Person

Patents Grantslast 30 patents

Semiconductor structure

Memory structure including elastic material based buffer column str...

Readout circuit layout structure, readout circuit, and memory layou...

Testing method, testing system, and testing apparatus for semicondu...

Through-silicon via (TSV) fault-tolerant circuit, method for TSV fa...

Circuit for testing a memory and test method thereof

Method and system for manufacturing semiconductor layer

Word line driving circuit and dynamic random access memory

Testing method for packaged chip, testing system for packaged chip,...

Word line drive circuit and dynamic random access memory

Memory test circuit apparatus and test method

Through-silicon via detecting circuit, detecting methods and integr...

Boundary test circuit, memory and boundary test method

Patents Applicationslast 30 patents

Semiconductor Structure and Method of Making the Same

SEMICONDUCTOR STRUCTURE

TESTING METHOD FOR PACKAGED CHIP, TESTING SYSTEM FOR PACKAGED CHIP,...

MEMORY STRUCTURE

TESTING METHOD, TESTING SYSTEM, AND TESTING APPARATUS FOR SEMICONDU...

READOUT CIRCUIT LAYOUT STRUCTURE, READOUT CIRCUIT, AND MEMORY LAYOU...

WORD LINE DRIVING CIRCUIT AND DYNAMIC RANDOM ACCESS MEMORY

WORD LINE DRIVE CIRCUIT AND DYNAMIC RANDOM ACCESS MEMORY

CIRCUIT FOR TESTING A MEMORY AND TEST METHOD THEREOF

METHOD AND SYSTEM FOR MANUFACTURING SEMICONDUCTOR LAYER

METHOD AND APPARATUS FOR JUDGING ABNORMALITY OF PROBE CARD

THROUGH-SILICON VIA DETECTING CIRCUIT, DETECTING METHODS AND INTEGR...

THROUGH-SILICON VIA (TSV) FAULT-TOLERANT CIRCUIT, METHOD FOR TSV FA...

BOUNDARY TEST CIRCUIT, MEMORY AND BOUNDARY TEST METHOD

MEMORY TEST CIRCUIT APPARATUS AND TEST METHOD