Chengpu Wang

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Upton, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Sensing mode atomic force microscope
- Patent number 7,095,020
- Issue date Aug 22, 2006
- Brookhaven Science Associates
- Paul V. C. Hough
- G01 - MEASURING TESTING
Information Patent Grant
Sensing mode atomic force microscope
- Patent number 6,818,891
- Issue date Nov 16, 2004
- Brookhaven Science Associates
- Paul V. C. Hough
- G01 - MEASURING TESTING
Information Patent Grant
Sensing mode atomic force microscope
- Patent number 6,518,570
- Issue date Feb 11, 2003
- Brookhaven Science Associates
- Paul V. C. Hough
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Sensing mode atomic force microscope
- Publication number 20050029450
- Publication date Feb 10, 2005
- Paul V.C. Hough
- G01 - MEASURING TESTING
Information Patent Application
Sensing mode atomic force microscope
- Publication number 20030146380
- Publication date Aug 7, 2003
- Paul V.C. Hough
- G01 - MEASURING TESTING