Chenxi LIN

Person

Newark, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method to predict yield of a device manufacturing process
- Patent number 12,055,904
- Issue date Aug 6, 2024
- ASML Netherlands B.V.
- Youping Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method to label substrates based on process parameters
- Patent number 12,045,555
- Issue date Jul 23, 2024
- ASML Netherlands B.V.
- Vahid Bastani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of manufacturing devices
- Patent number 12,044,980
- Issue date Jul 23, 2024
- ASML Netherlands B.V.
- Abraham Slachter
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for controlling a manufacturing process and associated appar...
- Patent number 11,947,266
- Issue date Apr 2, 2024
- ASML Netherlands B.V.
- Nicolaas Petrus Marcus Brantjes
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for determining root cause affecting yield in a semiconducto...
- Patent number 11,803,127
- Issue date Oct 31, 2023
- ASML Netherlands B.V.
- Chenxi Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining corrections for lithographic apparatus
- Patent number 11,754,931
- Issue date Sep 12, 2023
- ASML Netherlands B.V.
- Roy Werkman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method to predict yield of a device manufacturing process
- Patent number 11,714,357
- Issue date Aug 1, 2023
- ASML Netherlands B.V.
- Alexander Ypma
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Identification of hot spots or defects by machine learning
- Patent number 11,443,083
- Issue date Sep 13, 2022
- ASML Netherlands B.V.
- Jing Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods of guiding process models and inspection in a manufacturing...
- Patent number 11,183,434
- Issue date Nov 23, 2021
- ASML Netherlands B.V.
- Yu Cao
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for determining a control parameter for an apparatus utilize...
- Patent number 11,181,829
- Issue date Nov 23, 2021
- ASML Netherlands B.V.
- Cyrus Emil Tabery
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to predict yield of a device manufacturing process
- Patent number 11,086,229
- Issue date Aug 10, 2021
- ASML Netherlands B.V.
- Alexander Ypma
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
TRAINING MACHINE LEARNING MODELS BASED ON PARTIAL DATASETS FOR DEFE...
- Publication number 20240069450
- Publication date Feb 29, 2024
- ASML NETHERLANDS B.V.
- Nabeel Noor MOIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ACTIVE LEARNING-BASED DEFECT LOCATION IDENTIFICATION
- Publication number 20230401694
- Publication date Dec 14, 2023
- ASML NETHERLANDS B.V.
- Chenxi LIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR ADJUSTING A PATTERNING PROCESS
- Publication number 20230273529
- Publication date Aug 31, 2023
- ASML NETHERLANDS B.V.
- Satej Subhash KHEDEKAR
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
IDENTIFICATION OF HOT SPOTS OR DEFECTS BY MACHINE LEARNING
- Publication number 20220277116
- Publication date Sep 1, 2022
- ASML NETHERLANDS B.V.
- Jing SU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETERMINING CORRECTIONS FOR LITHOGRAPHIC APPARATUS
- Publication number 20220252988
- Publication date Aug 11, 2022
- ASML NETHERLANDS B.V.
- Roy WERKMAN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR CONTROLLING A MANUFACTURING PROCESS AND ASSOCIATED APPAR...
- Publication number 20220026810
- Publication date Jan 27, 2022
- ASML NETHERLANDS B.V.
- Nicolaas Petrus Marcus BRANTJES
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD TO PREDICT YIELD OF A DEVICE MANUFACTURING PROCESS
- Publication number 20220011728
- Publication date Jan 13, 2022
- ASML NETHERLANDS B.V.
- Youping ZHANG
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD OF MANUFACTURING DEVICES
- Publication number 20210397172
- Publication date Dec 23, 2021
- ASML NETHERLANDS B.V.
- Abraham SLACHTER
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR DETERMINING ROOT CAUSE AFFECTING YIELD IN A SEMICONDUCTO...
- Publication number 20210389677
- Publication date Dec 16, 2021
- ASML NETHERLANDS B.V.
- Chenxi LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR GENERATING CHARACTERISTIC PATTERN AND TRAINING MACHINE...
- Publication number 20210357566
- Publication date Nov 18, 2021
- ASML Netherland B.V.
- Mark Christopher SIMMONS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD TO PREDICT YIELD OF A DEVICE MANUFACTURING PROCESS
- Publication number 20210325788
- Publication date Oct 21, 2021
- ASML NETHERLANDS B.V.
- Alexander YPMA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR DETERMINING A CONTROL PARAMETER FOR AN APPARATUS UTILIZE...
- Publication number 20210132508
- Publication date May 6, 2021
- ASML NETHERLANDS B.V.
- Cyrus Emil TABERY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD TO LABEL SUBSTRATES BASED ON PROCESS PARAMETERS
- Publication number 20200356881
- Publication date Nov 12, 2020
- ASML NETHERLANDS B.V.
- Vahid BASTANI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD TO PREDICT YIELD OF A DEVICE MANUFACTURING PROCESS
- Publication number 20200103761
- Publication date Apr 2, 2020
- ASML NETHERLANDS B.V.
- Alexander YPMA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ASSIST FEATURE PLACEMENT BASED ON MACHINE LEARNING
- Publication number 20200050099
- Publication date Feb 13, 2020
- ASML NETHERLANDS B.V.
- Jing SU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS OF GUIDING PROCESS MODELS AND INSPECTION IN A MANUFACTURING...
- Publication number 20190348331
- Publication date Nov 14, 2019
- ASML NETHERLANDS B.V.
- Yu CAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IDENTIFICATION OF HOT SPOTS OR DEFECTS BY MACHINE LEARNING
- Publication number 20190147127
- Publication date May 16, 2019
- ASML NETHERLANDS B.V.
- Jing SU
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Method to predict yield of a device manufacturing process

Method to label substrates based on process parameters

Method of manufacturing devices

Method for controlling a manufacturing process and associated appar...

Method for determining root cause affecting yield in a semiconducto...

Method for determining corrections for lithographic apparatus

Method to predict yield of a device manufacturing process

Identification of hot spots or defects by machine learning

Methods of guiding process models and inspection in a manufacturing...

Method for determining a control parameter for an apparatus utilize...

Method to predict yield of a device manufacturing process

Patents Applicationslast 30 patents

TRAINING MACHINE LEARNING MODELS BASED ON PARTIAL DATASETS FOR DEFE...

ACTIVE LEARNING-BASED DEFECT LOCATION IDENTIFICATION

METHOD FOR ADJUSTING A PATTERNING PROCESS

IDENTIFICATION OF HOT SPOTS OR DEFECTS BY MACHINE LEARNING

METHOD FOR DETERMINING CORRECTIONS FOR LITHOGRAPHIC APPARATUS

METHOD FOR CONTROLLING A MANUFACTURING PROCESS AND ASSOCIATED APPAR...

METHOD TO PREDICT YIELD OF A DEVICE MANUFACTURING PROCESS

METHOD OF MANUFACTURING DEVICES

METHOD FOR DETERMINING ROOT CAUSE AFFECTING YIELD IN A SEMICONDUCTO...

METHODS FOR GENERATING CHARACTERISTIC PATTERN AND TRAINING MACHINE...

METHOD TO PREDICT YIELD OF A DEVICE MANUFACTURING PROCESS

METHOD FOR DETERMINING A CONTROL PARAMETER FOR AN APPARATUS UTILIZE...

METHOD TO LABEL SUBSTRATES BASED ON PROCESS PARAMETERS

METHOD TO PREDICT YIELD OF A DEVICE MANUFACTURING PROCESS

ASSIST FEATURE PLACEMENT BASED ON MACHINE LEARNING

METHODS OF GUIDING PROCESS MODELS AND INSPECTION IN A MANUFACTURING...

IDENTIFICATION OF HOT SPOTS OR DEFECTS BY MACHINE LEARNING