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Cheolsu Han
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Suwon-si, KR
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Patents Grants
last 30 patents
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Patent Grant
Particle beam mass spectrometer and particle measurement method by...
Patent number
10,283,339
Issue date
May 7, 2019
Korea Research Institute of Standards and Science
Chang Joon Park
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion source, and mass analysis apparatus including same
Patent number
9,673,035
Issue date
Jun 6, 2017
Korea Research Insitute of Standards and Science
Chang Joon Park
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Monochromator and charged particle apparatus including the same
Patent number
9,425,022
Issue date
Aug 23, 2016
Korea Research Institute of Standards and Science
Takashi Ogawa
G01 - MEASURING TESTING
Information
Patent Grant
Automatic landing method and apparatus for scanning probe microscop...
Patent number
7,891,016
Issue date
Feb 15, 2011
IUCF-HYU (Industry-University Cooperation Foundation Hanyang University
Haiwon Lee
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
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Patent Application
PARTICLE BEAM MASS SPECTROMETER AND PARTICLE MEASUREMENT METHOD BY...
Publication number
20180286655
Publication date
Oct 4, 2018
Korea Research Institute of Standards and Science
Chang Joon Park
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION SOURCE, AND MASS ANALYSIS APPARATUS INCLUDING SAME
Publication number
20160225600
Publication date
Aug 4, 2016
Korea Research Institute of Standards and Science
Chang Joon PARK
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MONOCHROMATOR AND CHARGED PARTICLE APPARATUS INCLUDING THE SAME
Publication number
20150371811
Publication date
Dec 24, 2015
Korea Research Institute of Standards and Science
Takashi OGAWA
G01 - MEASURING TESTING
Information
Patent Application
Automatic Landing Method and Apparatus for Scanning Probe Microscop...
Publication number
20090293160
Publication date
Nov 26, 2009
Haiwon Lee
G01 - MEASURING TESTING