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Cherif Ahrikencheikh
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Loveland, CO, US
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Patents Grants
last 30 patents
Information
Patent Grant
Determining points of maximum deflection of a printed circuit board...
Patent number
7,103,856
Issue date
Sep 5, 2006
Agilent Technologies, Inc.
Cherif Ahrikencheikh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optimized pin assignment with constraints
Patent number
6,873,147
Issue date
Mar 29, 2005
Agilent Technologies, Inc.
Cherif Ahrikencheikh
G01 - MEASURING TESTING
Information
Patent Grant
Determining support locations in a wireless fixture of a printed ci...
Patent number
6,839,883
Issue date
Jan 4, 2005
Agilent Technologies, Inc.
Cherif Ahrikencheikh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Determining via placement in the printed circuit board of a wireles...
Patent number
6,839,885
Issue date
Jan 4, 2005
Agilent Technologies, Inc.
Cherif Ahrikencheikh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for the management of forces in a wireless fix...
Patent number
6,667,628
Issue date
Dec 23, 2003
Agilent Technologies, Inc.
Cherif Ahrikencheikh
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for selecting test point nodes of a group of c...
Patent number
6,467,051
Issue date
Oct 15, 2002
Agilent Technologies, Inc.
Rodney A. Browen
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for electronic circuit model correction
Patent number
6,334,100
Issue date
Dec 25, 2001
Agilent Technologies, Inc.
Cherif Ahrikencheikh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for board model correction
Patent number
6,327,545
Issue date
Dec 4, 2001
Agilent Technologies, Inc.
Rodney A. Browen
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for selecting stimulus locations during limite...
Patent number
6,266,787
Issue date
Jul 24, 2001
Agilent Technologies, Inc.
John E. McDermid
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for selecting targeted components in limited a...
Patent number
6,263,476
Issue date
Jul 17, 2001
Agilent Technologies
Rodney A. Browen
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for correcting for detector inaccuracies in li...
Patent number
6,237,118
Issue date
May 22, 2001
Agilent Technologies
Cherif Ahrikencheikh
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for limited access circuit test
Patent number
6,233,706
Issue date
May 15, 2001
Agilent Technologies
Cherif Ahrikencheikh
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Determining points of maximum deflection of a printed circuit board...
Publication number
20050093552
Publication date
May 5, 2005
Cherif Ahrikencheikh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Optimized pin assignment with constraints
Publication number
20040263152
Publication date
Dec 30, 2004
Cherif Ahrikencheikh
G01 - MEASURING TESTING
Information
Patent Application
Determining via placement in the printed circuit board of a wireles...
Publication number
20040040008
Publication date
Feb 26, 2004
Cherif Ahrikencheikh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Determining support locations in a wireless fixture of a printed ci...
Publication number
20040031000
Publication date
Feb 12, 2004
Cherif Ahrikencheikh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and apparatus for determining proper trace widths for printe...
Publication number
20040010388
Publication date
Jan 15, 2004
Cherif Ahrikencheikh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR THE MANAGEMENT OF FORCES IN A WIRELESS FIX...
Publication number
20030184329
Publication date
Oct 2, 2003
Cherif Ahrikencheikh
G01 - MEASURING TESTING