Cheryl D. Hartfield

Person

McKinney, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Total release method for sample extraction in an energetic-beam ins...
- Patent number 9,349,573
- Issue date May 24, 2016
- Omniprobe, Inc.
- Rocky Kruger
- G01 - MEASURING TESTING
Information Patent Grant
Gas injection system for energetic-beam instruments
- Patent number 9,097,625
- Issue date Aug 4, 2015
- Omniprobe, Inc.
- Rocky Kruger
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for processing samples held by a nanomanipulator
- Patent number 8,759,765
- Issue date Jun 24, 2014
- Omniprobe, Inc.
- Cheryl D. Hartfield
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for extracting frozen specimens and manufacture of specimen...
- Patent number 8,513,622
- Issue date Aug 20, 2013
- Omniprobe, Inc.
- Cheryl Hartfield
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for acquiring simultaneous and overlapping opt...
- Patent number 8,440,969
- Issue date May 14, 2013
- Omniprobe, Inc.
- Thomas M. Moore
- G01 - MEASURING TESTING
Information Patent Grant
Rapid method for sub-critical fatigue crack growth evaluation
- Patent number 7,495,749
- Issue date Feb 24, 2009
- Texas Instruments Incorporated
- Cheryl Diane Hartfield
- C21 - METALLURGY OF IRON
Information Patent Grant
Statistical method for identifying microcracks in insulators
- Patent number 7,225,681
- Issue date Jun 5, 2007
- Texas Instruments Incorporated
- Daniel J. Stillman
- G01 - MEASURING TESTING
Information Patent Grant
Combined electrical test and mechanical test system for thin film c...
- Patent number 6,752,012
- Issue date Jun 22, 2004
- Texas Instruments Incorporated
- Jerry J. Broz
- G01 - MEASURING TESTING
Information Patent Grant
Method for chemically reworking metal layers on integrated circuit...
- Patent number 6,435,398
- Issue date Aug 20, 2002
- Texas Instruments Incorporated
- Cheryl Hartfield
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for sample separation and lift-out with one cut
- Patent number 6,420,722
- Issue date Jul 16, 2002
- Omniprobe, Inc.
- Thomas M. Moore
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD TO PREPARE A SAMPLE FOR ATOM PROBE TOMOGRAPHY (APT), PREPARA...
- Publication number 20220349789
- Publication date Nov 3, 2022
- Carl Zeiss SMT GMBH
- Sascha Christian Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RAPID TEM SAMPLE PREPARATION METHOD WITH BACKSIDE FIB MILLING
- Publication number 20160189929
- Publication date Jun 30, 2016
- OMNIPROBE, INC.
- Matt Hammer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TOTAL RELEASE METHOD FOR SAMPLE EXTRACTION IN AN ENERGETIC-BEAM INS...
- Publication number 20160035540
- Publication date Feb 4, 2016
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Rocky Kruger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS INJECTION SYSTEM FOR ENERGETIC-BEAM INSTRUMENTS
- Publication number 20150318141
- Publication date Nov 5, 2015
- Rocky Kruger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS INJECTION SYSTEM FOR ENERGETIC-BEAM INSTRUMENTS
- Publication number 20140014742
- Publication date Jan 16, 2014
- OMNIPROBE, INC.
- Rocky Kruger
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD FOR EXTRACTING FROZEN SPECIMENS AND MANUFACTURE OF SPECIMEN...
- Publication number 20130091875
- Publication date Apr 18, 2013
- OMNIPROBE, INC.
- Cheryl Hartfield
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PROCESSING SAMPLES HELD BY A NANOMANIPULATOR
- Publication number 20130037713
- Publication date Feb 14, 2013
- OMNIPROBE, INC.
- Cheryl D. Hartfield
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD AND APPARATUS FOR ACQUIRING SIMULTANEOUS AND OVERLAPPING OPT...
- Publication number 20120025075
- Publication date Feb 2, 2012
- OMNIPROBE, INC.
- Thomas M. Moore
- G02 - OPTICS
Information Patent Application
Rapid method for sub-critical fatigue crack growth evaluation
- Publication number 20070051437
- Publication date Mar 8, 2007
- TEXAS INSTRUMENTS INCORPORATED
- Cheryl Diane Hartfield
- C21 - METALLURGY OF IRON
Information Patent Application
Statistical method for identifying microcracks in insulators
- Publication number 20060273780
- Publication date Dec 7, 2006
- Daniel J. Stillman
- G01 - MEASURING TESTING
Information Patent Application
Method of improving contact resistance
- Publication number 20040115934
- Publication date Jun 17, 2004
- Jerry Broz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Combined electrical test and mechanical test system for thin film c...
- Publication number 20030140684
- Publication date Jul 31, 2003
- Jerry J. Broz
- G01 - MEASURING TESTING
Information Patent Application
Method for chemically reworking metal layers on integrated circuit...
- Publication number 20010050303
- Publication date Dec 13, 2001
- Cheryl Hartfield
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for sample separation and lift-out
- Publication number 20010045511
- Publication date Nov 29, 2001
- Thomas M. Moore
- G01 - MEASURING TESTING

Cheryl D. Hartfield

Person

Patents Grantslast 30 patents

Total release method for sample extraction in an energetic-beam ins...

Gas injection system for energetic-beam instruments

Method for processing samples held by a nanomanipulator

Method for extracting frozen specimens and manufacture of specimen...

Method and apparatus for acquiring simultaneous and overlapping opt...

Rapid method for sub-critical fatigue crack growth evaluation

Statistical method for identifying microcracks in insulators

Combined electrical test and mechanical test system for thin film c...

Method for chemically reworking metal layers on integrated circuit...

Method for sample separation and lift-out with one cut

Patents Applicationslast 30 patents

METHOD TO PREPARE A SAMPLE FOR ATOM PROBE TOMOGRAPHY (APT), PREPARA...

RAPID TEM SAMPLE PREPARATION METHOD WITH BACKSIDE FIB MILLING

TOTAL RELEASE METHOD FOR SAMPLE EXTRACTION IN AN ENERGETIC-BEAM INS...

GAS INJECTION SYSTEM FOR ENERGETIC-BEAM INSTRUMENTS

GAS INJECTION SYSTEM FOR ENERGETIC-BEAM INSTRUMENTS

METHOD FOR EXTRACTING FROZEN SPECIMENS AND MANUFACTURE OF SPECIMEN...

METHOD FOR PROCESSING SAMPLES HELD BY A NANOMANIPULATOR

METHOD AND APPARATUS FOR ACQUIRING SIMULTANEOUS AND OVERLAPPING OPT...

Rapid method for sub-critical fatigue crack growth evaluation

Statistical method for identifying microcracks in insulators

Method of improving contact resistance

Combined electrical test and mechanical test system for thin film c...

Method for chemically reworking metal layers on integrated circuit...

Method for sample separation and lift-out