Chester J. Everline

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Pasadena, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for circuit lifetime evaluation
- Patent number 8,392,869
- Issue date Mar 5, 2013
- California Institute of Technology
- Timothy L. Heaps
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR CIRCUIT LIFETIME EVALUATION
- Publication number 20120117528
- Publication date May 10, 2012
- California Institute of Technology
- Timothy L. Heaps
- G01 - MEASURING TESTING